PCIE test card

A test card and specification technology, applied in the field of PCI-Express test card, can solve the problems of increasing test cost, time-consuming and laborious testing, etc., and achieve the effect of reducing test cost

Inactive Publication Date: 2008-10-01
HONG FU JIN PRECISION IND (SHENZHEN) CO LTD +1
View PDF0 Cites 15 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

At present, when testing PCIE slots of different specifications on the motherboard, it is necessary to prepare PCIE test cards of different specifications, resulting in time-consuming and labor-intensive testing and increased testing costs

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • PCIE test card
  • PCIE test card

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0010] Please refer to figure 1 and figure 2 The preferred embodiment of the PCIE test card of the present invention includes a control module 10, a bus arbiter 20, an indicating device 30, a plurality of PCIE pins 40 (being commonly called as "gold fingers") and corresponding to the PCIE pins 40 Several PCIE buses 50.

[0011] The PCIE pin 40 of the PCIE test card described in the present embodiment has four, is respectively PCIEx1 pin, PCIEx4 pin, PCIEx8 pin and PCIEx16 pin, is located in each side juxtaposition of described PCIE test card, respectively It is used to plug into the PCIE slot of the corresponding specification on the motherboard to be tested. In this embodiment, the PCIEx8 pin test-the PCIEx8 slot 70 on the motherboard 60 to be tested is taken as an example for illustration. There are four PCIE buses 50, which are PCIEx1 bus, PCIEx4 bus, PCIEx8 bus and PCIEx16 bus.

[0012] The control module 10 can support pins of PCIEx1, PCIEx4, PCIEx8 and PCIEx16 speci...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

No PUM Login to view more

Abstract

The present invention provides a PCIE test card, including a control module, a bus arbiter, an indicating device, at least two PCIE pins having different specifications and at least PCIE bus having different specifications which is corresponding to the PCIE pins, PCIE pins are used for cuttage grafting PCIE slot of the mainboard corresponding specifications to be tested, the control module transmits data with the corresponding PCIE pins via the PCIE bus, the bus arbiter controls the control module and switches to the corresponding PCIE mode according to the specifications of PCIE slot of the PCIE pins cuttage grafting, the indicating device is electrically connected with the control module, used for showing the test whether passing or not. The PCIE test card gathers PCIE pins of different specifications, processing test by cottage grafting PCIE pins of different specifications, substituting for multiple PCIE test cards of different specifications, reducing the test cost.

Description

technical field [0001] The invention relates to a test device, in particular to a PCI-Express (abbreviated as PCIE) test card. Background technique [0002] With the increasing performance requirements of computers and communication equipment, the data throughput of traditional low-speed parallel buses such as PCI can no longer meet the requirements. PCI Sig (PCI Special Interest Organization) jointly developed the PCIE specification with control module manufacturers and measuring instrument manufacturers. , Increase the serial data rate to 2.5Gbps and the data bandwidth to 80Gbps. PCIE interfaces vary according to the bus width, including PCIEx1, PCIEx4, PCIEx8, and PCIEx16. [0003] Existing motherboards include PCIEx1, PCIEx4, PCIEx8, and PCIEx16 slots, and different PCIE slots require PCIE cards of corresponding specifications to be plugged in. At present, when testing PCIE slots of different specifications on the motherboard, it is necessary to prepare PCIE test cards...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
Patent Type & Authority Applications(China)
IPC IPC(8): G06F11/267
CPCG06F13/409G06F2213/0026
Inventor 叶宗德张俐莹
Owner HONG FU JIN PRECISION IND (SHENZHEN) CO LTD
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap