Linear phase inversion wavefront sensor based on planar array CCD

Abstract

The invention discloses a linear phase inversion wavefront sensor based on an area array CCD. The sensor comprises a diffraction imaging optical system, the area array CCD, an image acquisition card, a PC computer, an axial translation platform, a transverse translation platform and a base; the invention is characterized in that: the diffraction imaging optical system is fixed on the base; the area array CCD is fixed on the axial translation platform; then the axial translation platform is fixed on the transverse translation platform which is also fixed on the base; the area array CCD is positioned on a defocusing plane of the diffraction imaging optical system in order that a parallel light source runs through the diffraction imaging optical system and forms a facula positioned in the center of a target surface of the area array CCD; an image of the area array CCD is acquired to the PC computer by the image acquisition card and processed. The bare engine of the wavefront sensor has simple structure, makes for reducing the difficulty in system hardware development, reduces the size and expense and has small computational amount and rapid computed speed.

Description

technical field [0001] The invention belongs to the technical field of optical information measurement, and relates to a sensor for measuring the wavefront of an incident light beam, in particular to a linear phase inversion wavefront sensor based on an area array CCD. Background technique [0002] In the application fields of adaptive optics, optical detection, and beam diagnosis, it is necessary to measure the wavefront of the beam, especially in the adaptive optics system, it is necessary to quickly measure the wavefront information for real-time control of the wavefront. The wavefront sensor usually continuously measures the phase distortion of the dynamic incident wavefront on the entrance pupil surface in real time, and provides real-time control signals for the wavefront corrector, so that the optical system can achieve a near-diffraction-limited image quality level. At present, many kinds of wavefront sensors for measuring wavefront have been developed, such as dynam...

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Problems solved by technology

[0021] But this patent only proposed this method, did not propose a specific wavefront sensor structure, and applied it to actual wavefront detection

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