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System for measuring high temperature moire interference deformation

A moiré interference and measurement system technology, applied in the direction of measuring devices, instruments, optical devices, etc., can solve the problems that the temperature field has a great influence on the measurement optical path, the imaging distance is short, and the position of the test piece cannot be adjusted, and the structure is compact, Increased imaging distance and ease of use

Inactive Publication Date: 2009-01-21
TSINGHUA UNIV
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Problems solved by technology

However, these systems are mainly developed for conventional measurement, the imaging distance is short, and the temperature field has a great influence on the measurement optical path, and the adjustment bracket is generally connected with the specimen loading frame. Adjust the position of the specimen
These reasons lead to the fact that the existing measurement system cannot be directly applied to the measurement of material deformation under high temperature conditions.

Method used

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  • System for measuring high temperature moire interference deformation
  • System for measuring high temperature moire interference deformation
  • System for measuring high temperature moire interference deformation

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Embodiment approach

[0023] Such as figure 1 As shown, the high-temperature moiré interference deformation measurement system of the present invention is mainly composed of an image acquisition system 1, a laser 2, an optical coupler 3, a high-temperature furnace 4 with an observation window, a six-dimensional adjustment frame 5, and a moiré interference optical path system Composition, all installed on a test bench. The moiré interference optical path system includes a moiré interference optical element box 6 , a lens 8 and a grating 44 . The moiré interference optical element box 6 is integrated into a dark box, which is fixed on the test bench through a six-dimensional adjustment frame 5 . The image acquisition system 1 is fixed on the moiré interference optical element box 6 by a three-dimensional adjustment frame 10 and screws, and the image acquisition system 1, the lens 8 and the grating 44 are located on the same straight line. The grating 44 is pasted on the surface of the test piece 7 a...

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Abstract

A high temperature moire interference deformation measuring system belongs to the technical field of optical measurement mechanics, engineering material, component deformation and displacement testing. The invention is formed by an optical maser, a light splitting coupler, a high temperature furnace, a six-dimension adjustable bracket and a moire interference optical path system. The measuring system can realize the high precision timing measuring for u and v displacement fields under the high temperature condition, and uses the green light illumination to avoid the hot radiation red light from affecting the measurement, and realizes the automatic measurement of a displacement field inside a surface through an optical switch, and solves the observing window design of the high temperature furnace through a cross form split double-layer silica glass, and simultaneously uses a lens with 600 lights / mm optical grating, long focus and great diameter as a field lens, thereby increasing the measuring object distance, reducing the affect of high temperature to the measuring system, and increasing the fringe resolution factor. The problem that tested element in the high temperature furnace is difficult to regulate is solved through the six-dimension adjustable bracket and the regulation of the moire interference optical path system. The system has convenient usage and high measuring sensitivity.

Description

technical field [0001] A high-temperature moiré interference deformation measurement system belongs to the technical fields of photometric mechanics, engineering materials, component deformation and displacement testing. Background technique [0002] In recent years, with the development of science and technology, the application of materials under high temperature conditions has become more and more extensive, such as high temperature pipelines in power plants, heat insulation layers for high-altitude detection, and so on. Therefore, characterizing the mechanical properties of materials under high temperature conditions has become a focus and hot spot of research at this stage, and how to obtain the deformation of materials under high temperature conditions has become the primary problem to be solved in this research. Conventional deformation measurement methods mainly include electrical measurement methods and optical measurement methods. The electrical measurement method...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01B11/16
Inventor 戴福隆谢惠民花韬方岱宁
Owner TSINGHUA UNIV
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