Automatized magnetic transportation measuring system using phase lock amplifying technology
Patent Information
- Authority / Receiving Office
- CN Β· China
- Current Assignee / Owner
- SHANGHAI INST OF TECHNICAL PHYSICS - CHINESE ACAD OF SCI
- Publication Date
- 2009-02-18
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Abstract
Description
technical field
[0001] The invention relates to a technology for measuring the electrical transport properties of materials under low temperature and strong magnetic fields, specifically an automatic magnetic transport measurement system using lock-in amplification technology, which is mainly suitable for the electrical transport of semiconductor materials under deep low temperature and strong magnetic fields Precise measurement of quantum effects. Background technique
[0002] In the physical research process of semiconductor materials and devices, magnetic transport measurement has always been an important and direct research method. Under different temperature and magnetic field conditions, the electrical transport properties undergo two processes, classical and quantum. By changing the external conditions such as temperature and magnetic field, not only the basic physical quantities such as carrier concentration and mobility in the sample can be obtained, but also some ...