Emulation test method for active thermal-control circuit of aerospace optical remote sensor

Abstract

The invention relates to a simulation test method for the active thermal control circuit of a space optical remote sensor. A test system consisting of a voltage conditioning circuit, an analog to digital conversion circuit, a computer PCI bus driving circuit, an FPGA, a digital potentiometer synthesis conversion processing circuit and a microcomputer is connected to the active thermal control circuit of the optical remote sensor being tested, which forms an optical remote sensor active thermal control circuit closed loop simulation test system and realizes the aim of simulation test. At first, the heating information of a control circuit is collected, the validity of the information is judged, and then according to a pre-constructed thermal network mathematical model, temperature information after changing is fed back to the active thermal control circuit, therefore, the effect of maintaining heating is simulated. The test method can satisfy the long-term, rapid, convenient and clear test and monitor need of the active thermal control circuit of the optical remote sensor.

Description

technical field [0001] The invention relates to a reliability detection technology for an active thermal control circuit of an aerospace optical remote sensor, in particular to a simulation detection method for an active thermal control system of an aerospace optical remote sensor. Background technique [0002] The aerospace optical remote sensor is the core equipment of the spacecraft payload system. According to the ground remote control command center, it issues commands and parameters to the aerospace optical remote sensor, and controls the optical imaging system to complete the camera task of the ground scene. The quality of the optical imaging system directly affects the image acquisition effect of the optical remote sensor. Since the aerospace optical remote sensor works in a space environment, the temperature difference between day and night, the sunny side and the dark side without sunlight is very large, coupled with the influence of heat generated by the electroni...

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Problems solved by technology

The previous cumbersome test methods can no longer meet the requirements

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