Method for measuring high-temperature complex dielectric constants based on terminal short-circuit method

Abstract

The invention belongs to the technical field of microwaves and millimeter waves, and in particular relates to a method for measuring complex dielectric constants of microwave and millimeter wave dielectric materials. When the method tests the complex dielectric constants of high-temperature dielectric materials by adopting a terminal short-circuit method, two same rectangular test waveguides are connected with a vector network analyzer respectively, and each rectangular test waveguide is formed by connecting a radiating waveguide, a heat insulation waveguide, a high-temperature waveguide and a short-circuit board sequentially; and the method comprises the following steps: firstly, measuring emission coefficients of two waveguides at room temperature; secondly, loading a dielectric sample to be tested in one of the test waveguides; thirdly, measuring the emission coefficients of the two waveguides at high test temperature, and correcting the emission coefficient of the waveguide loaded with the test sample by using the emission coefficient of an empty waveguide to further obtain the complex dielectric constant of the dielectric sample to be tested through calculation. By using the method for measuring the high temperature complex dielectric constants of the dielectric materials, the test error can be reduced so that the precision of the test result is higher; and simultaneously, the method only performs the high-temperature measurement once, so that the test efficiency is greatly improved.

Description

technical field [0001] The invention belongs to the technical field of microwave and millimeter wave, in particular to the complex permittivity testing technology of microwave and millimeter wave dielectric materials. Background technique [0002] Microwave and millimeter wave dielectric materials are widely used in microwave and millimeter wave devices and systems. The complex dielectric constant is one of the important electrical performance index parameters of microwave and millimeter wave dielectric materials, and it is also the main basis for evaluating its microwave performance and an important parameter for microwave device design. In the research and application of dielectric materials, the actual measurement of the complex permittivity is required. The terminal short circuit method is often used to measure the complex dielectric constant of dielectric materials at room temperature or high temperature. This method has the advantages of simple fixture design, wide t...

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Problems solved by technology

In the existing method of using the terminal short circuit method to test the electrical parameters of materials at high temperature, the microwave parameters of the test waveguide section cannot be deducted from the measured parameters in real time and the length, that is, the change of the phase can be obtained in real time, resulting in an increase in the test error of the complex dielectric constant

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