Method and device for measuring thickness of non-conductive coating layer on inner surface of capacitance metal

A coating thickness and non-conductive technology, which is applied in the field of non-conductive coating thickness measurement, can solve the problems of large volume and inconvenient detection of inner surface coating thickness, etc., and achieve high measurement accuracy, strong anti-interference ability and good robustness Effect

Inactive Publication Date: 2009-12-30
CHANGCHUN UNIV OF TECH
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Problems solved by technology

[0003] The invention provides a method and device for measuring the thickness of a non-conductive coating on the inner surface of a capacitive metal, which solves the problem that the existing inductance or eddy current type non-conductive coating thickness measuring instrument has a large volume and is inconvenient to detect the coating thickness of the inner surface the puzzle

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  • Method and device for measuring thickness of non-conductive coating layer on inner surface of capacitance metal

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Embodiment Construction

[0010] according to figure 1 As shown, the measurement device of the present invention is composed of two parts, a capacitance digital sensor and a measurement host, wherein the capacitance digital sensor includes: two measurement plates, a capacitance-to-digital converter (integrated chip AD7745), a microprocessor (STC10F08XE) The measuring pole plate is composed of metal foil solidified on the flexible body, which can be closely attached to the surface of the workpiece to be tested during detection; the measuring pole plate is connected to the signal input terminal of the capacitance-to-digital converter, and the capacitance signal is converted into a digital signal. by I 2 The C bus is sent to the microprocessor (STC10F08XE), and the microprocessor (STC10F08XE) sends the processed signal to the single-chip microcomputer (STC10F12XE) in the measurement host; the microprocessor (STC10F08XE) also sends a control signal to the capacitance-to-digital converter to realize its fu...

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Abstract

The invention provides a method and a device for measuring thickness of non-conductive coating layer on the inner surface of capacitance metal, comprising a capacitance digital sensor and a measuring host; a measuring pad is composed of metal foil solidified on a flexible body and is connected with the input end of signal of a capacitance-digital converter to convert capacitive signal into digital signal, the digital signal is sent to a microprocessor by an I<2>C bus, and then the processed signal is sent to a singlechip in the measuring host; the singlechip is connected with the microprocessor by a serial interface so as to convert received signal to the distance between capacitance plates, thus the thickness of a coating layer to be measured is obtained. Capacitance range generated among the measuring pad, a matrix to be measured and the coating layer is used as detection signal, therefore, the device has the characteristics of small size, high precision, strong anti-interference ability, good robustness and the like. The device of the invention can be applied to sites which have limitations to the space size of measuring devices, and the minimum diameter of the inner surface of the metal can be 25mm, thus greatly improving the quality of non-conductive coating layers.

Description

technical field [0001] The invention provides a method and device for measuring the thickness of a non-conductive coating on a capacitive metal inner surface, which is an improvement on the existing non-conductive coating measurement method and belongs to the technical field of electronic detection instruments. Background technique [0002] Fast, accurate and stable measurement of the thickness of non-conductive coatings on metal substrates is essential to ensure the quality of these coatings. These coatings generally play the role of anti-corrosion protection and decoration and beautification, mainly including paints, anti-corrosion coatings, etc. It is widely used in automobiles, home appliances, oil pipeline transportation, chemical containers, etc. At present, the typical method of measuring the thickness of non-conductive coating is inductance and eddy current sensor. The head must be perpendicular to the surface to be measured, so the minimum diameter it can measure ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01B7/06
Inventor 马风雷韦丽君
Owner CHANGCHUN UNIV OF TECH
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