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Device for heating needle tip of scanning tunnel microscope

A technology of scanning tunneling and heating device, applied in the field of scanning tunneling microscope, can solve the problems of increasing effective resistance, needle tip and sample collision, etc.

Inactive Publication Date: 2011-04-13
NANJING UNIV
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

The oxide layer increases the effective resistance, so the tip and sample may collide before the set tunneling current is obtained

Method used

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  • Device for heating needle tip of scanning tunnel microscope
  • Device for heating needle tip of scanning tunnel microscope
  • Device for heating needle tip of scanning tunnel microscope

Examples

Experimental program
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Effect test

Embodiment Construction

[0013] The invention provides a scanning tunneling microscope tip heating device, which includes a support for electron beam tip heating, the support includes two filaments, and the two filaments are arranged between a pair of contact arms; the pair of contact arms and The other parts of the above-mentioned electron beam heating bracket are insulated; it also includes a base platform, which is used to assemble the above-mentioned electron beam heating needle tip bracket and supply power to the tungsten wire and the needle tip; the above-mentioned electron beam heating needle tip bracket heating includes a needle tip bracket , there are three pillars under the support, and the frontmost pillar inserted into the needle point heating carrier is insulated from other parts of the needle point support, and is only connected to the needle point, so as to separately add a positive potential to the needle point. Below we provide concrete example to illustrate this invention.

[0014] S...

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Abstract

The invention relates to a device for heating a needle tip of a scanning tunnel microscope, which is a device for heating a needle tip by an electronic beam. The device comprises an electronic beam needle tip heating carrier which comprises two lamp filaments; both lamp filaments are arranged between a pair of contact arms; the contact arms are insulated from other parts of the electronic beam needle tip heating carrier. The device also comprises a base platform, wherein the base platform is used for loading the electronic beam needle tip heating carrier and supplying power to the tungsten filaments and the needle tip; the electronic beam heating needle tip bracket also comprises a needle tip bracket; and a needle tip bracket comprises a column which is insulated from other parts of the needle tip bracket, is conducted with the needle tip and singly adds electric potential to the needle tip.

Description

technical field [0001] The invention relates to scanning tunneling microscope technology, which is a device for heating the needle point of scanning tunneling microscope. Background technique [0002] The scanning tunneling microscope characterizes the morphology of the sample by using the tunneling current on the probe and the sample surface as the feedback signal. According to the quantum effect, the tunneling current is exponentially related to the distance between the probe and the sample surface. Therefore, using the tunneling current as a feedback signal makes the scanning tunneling microscope have extremely high spatial resolution and can realize real-space atomic-level imaging of the sample. . At the same time, by changing the tunneling conditions, the electronic structure of the sample surface can be measured in micro-regions. In recent years, people have successfully realized the measurement of the magnetization direction of the sample by using the tunnel magneto...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01N13/12
Inventor 丁海峰孙亮曹荣幸
Owner NANJING UNIV