Three-dimensional morphological virtual modeling method of corn silk
A technology of three-dimensional shape and modeling method, which is applied in the field of three-dimensional modeling and virtual agriculture in computer graphics, virtual modeling and digital design of three-dimensional shape of crops, and can solve the problem of not having crop physiological characteristics, difficult to adapt to corn ear model, It does not meet the problems of agricultural knowledge background, etc., and achieves the effect of easy operation, strong controllability and strong realistic effect.
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
Method used
Image
Examples
Embodiment Construction
[0044] The method for virtual modeling of the three-dimensional shape of corn ears proposed by the present invention is described as follows in conjunction with the accompanying drawings and examples.
[0045] Such as figure 1 Shown, the flowchart of the method of the present invention, step S1 is to observe the morphological structure of corn ears, such as figure 2 A schematic diagram of the morphological structure of the ear of maize is shown. Determine the characteristic parameters of the three-dimensional shape of corn ears, such as ear length: 30cm, ear diameter: 10cm, ear stalk length: 14cm, ear stalk curvature: medium, number of ear pedicle nodes: 10, bract leaf coverage: medium, ear grains Number of rows: 12, number of grains per row: 40, arrangement of grains: straight, balding rate: 0.11, color of grains: yellow / orange.
[0046] Step S2 is to establish a three-dimensional morphological virtual model of corn ears according to the characteristic parameters, includin...
PUM
Abstract
Description
Claims
Application Information
- R&D Engineer
- R&D Manager
- IP Professional
- Industry Leading Data Capabilities
- Powerful AI technology
- Patent DNA Extraction
Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.
© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com