Method for evaluating precision of large-scale industrial photogrammetry system and benchmark device

A technology of industrial photography and surveying systems, applied in surveying devices, photogrammetry/video surveying, using optical devices, etc., can solve the problem of complex error sources, incomplete photogrammetry spatial error models, complex digital photogrammetry systems, etc. problem, to achieve the effect of improving the measurement accuracy

Inactive Publication Date: 2010-04-14
BEIJING INFORMATION SCI & TECH UNIV
View PDF0 Cites 20 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Among them, the research on digital photogrammetry accuracy evaluation includes the following two aspects: (1) Independently analyze the error factors in the photogrammetry link, such as camera calibration, station angle, measuring point center positioning and other factors respectively affect the photogrammetry accuracy. However, a perfect photogrammetric spatial error model has not yet been established; (2) Use a fixed-length ruler to test and evaluate the measurement accuracy of the system at the photogrammetric site
Due to the complexity and flexibility of the digital photogrammetry system, especially the digital photogrammetry system for large-scale on-site measurement is affected by various factors such as came

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Method for evaluating precision of large-scale industrial photogrammetry system and benchmark device
  • Method for evaluating precision of large-scale industrial photogrammetry system and benchmark device
  • Method for evaluating precision of large-scale industrial photogrammetry system and benchmark device

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0016] The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only some, not all, embodiments of the present invention. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present invention.

[0017] In the process of large-scale industrial photogrammetry, there are many error factors and complex distribution rules that affect the large-scale industrial photogrammetry on site, including the error factors of the photogrammetry system itself, the error factors of the on-site measurement plan and measurement layout, and the error factors of the environment and lighting. Wait.

[0018] figure 1 It is a schematic flow chart of an embodiment of the accur...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

No PUM Login to view more

Abstract

The invention discloses a method for evaluating the precision of a large-scale industrial photogrammetry system and a benchmark device. The method comprises the following steps: obtaining first three-dimensional coordinate information of a reflection target spot from the benchmark device by using a laser tracker, wherein the first three-dimensional coordinate information forms a space benchmark field; obtaining second three-dimensional coordinate information of the reflection target spot from the benchmark device by using the photogrammetry system, wherein the second three-dimensional coordinate information forms a space measurement field; and obtaining a space error field by the space benchmark field and the space measurement field. The method for evaluating the precision of a large-scale industrial photogrammetry system and the benchmark device obtain the space error field by the space benchmark field and the space measurement field, and analyze the error sources in the photogrammetry system by the space error field and further enhance the measurement precision of the photogrammetry system in large-scale industrial photogrammetry.

Description

technical field [0001] The invention relates to photogrammetry technology, in particular to an accuracy evaluation method and reference device of a large-scale industrial photogrammetry system. Background technique [0002] With the rapid development of modern industry, precise three-dimensional measurement of large objects is required. Due to the large measurement range, high precision requirements and on-site dynamic measurement of large objects, the measurement technology based on three-coordinate measuring machine (CMM) cannot meet the requirements. On-site digital photogrammetry technology. [0003] At present, the research on digital photogrammetry at home and abroad is mainly focused on some key technologies, including: on-site self-calibration technology and solution method of camera internal and external orientation parameters; precision evaluation technology and method of measurement network; image to realize system measurement automation matching technology, etc....

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
IPC IPC(8): G01B11/00G01C11/00
Inventor 董明利祝连庆吕乃光燕必希杨健陈瑞保
Owner BEIJING INFORMATION SCI & TECH UNIV
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products