Alkaline aqueous solution composition for treating a substrate
An alkaline aqueous solution, substrate treatment technology, applied in the directions of non-surface-active detergent compositions, inorganic non-surface-active detergent compositions, detergent compositions, etc., can solve the problem of decreased processing capacity, longer semiconductor manufacturing processes, and increased costs and other problems, to achieve the effect of shortening the cleaning process, increasing the processing capacity, and preventing adsorption
Inactive Publication Date: 2010-06-02
KANTO CHEM CO INC
View PDF14 Cites 15 Cited by
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
Usually after etching, it is removed by cleaning with an acid such as dilute hydrofluoric acid, but especially in low-resistance substrates with a high concentration of boron and the like, Cu and Ni are easy to diffuse inside, and Ni in sodium hydroxide or hydroxide Potassium is used at a temperature of around 80°C to cause diffusion, so surface cleaning with acid cannot remove internally diffused metal impurities, which has become a problem
In addition, in addition to Cu and Ni, a large amount of transition metals such as Fe are actually adsorbed on the surface of the silicon wafer, and it is necessary to remove them by cleaning with an acidic cleaning solution. decreased throughput, etc.
This cleaning process accounts for about 1 / 3 of the semiconductor manufacturing process. If two types of liquids, alkaline cleaning liquid and acidic cleaning liquid, are used for the entire process, the following problems will arise: the semiconductor manufacturing process will become longer and more complicated, and the cost will increase. drop etc.
However, these chelating agents or complexing agents are all used in the cleaning solution SC-1, which is a mixture of ammonia and hydrogen peroxide, which is a representative cleaning solution used in semiconductor processes. It is also effective, but it is difficult to form a stable complex in a strong alkaline aqueous solution such as sodium hydroxide or tetramethylammonium hydroxide, and there is no sufficient effect
Therefore, there is no substrate containing strong alkali components such as sodium hydroxide or tetramethylammonium hydroxide that can effectively prevent the metal impurities in the alkali component from being adsorbed on the substrate and can effectively clean and remove the metal adsorbed on the substrate. Etching and cleaning solutions for processing
Method used
the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View moreExamples
Experimental program
Comparison scheme
Effect test
Embodiment 1
Embodiment 2
Embodiment 3
the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More PUM
Login to View More
Abstract
An aqueous solution of ammonia, tetramethylammonium hydroxide and sodium hydroxide, etc. has been used as a cleaning liquid and an etching liquid of a semiconductor substrate and a glass substrate. However, the metal impurities in the alkali components are adsorbed onto the substrate surface during treatment, so that a process for removing the adsorbed metal impurities is necessary as the next process. In addition, in the case of the cleaning liquid, though it is effective in the removal of fine particles, the metal impurities cannot be cleaned, so that it is necessary to carry out acid cleaning, which makes the process complicated. According to the present invention, the alkaline aqueous solution for treating a substrate wherein an alkali component and a specific chelating agent are combined prevents adsorption of metal impurities onto the substrate, and further cleans and removes the metals adhered to the substrate. If necessary, it is also possible to add a metal anticorrosive and a surfactant to suppress corrosion of the metal materials, or enhance affinity to the substrate and ability for removing fine particles.
Description
technical field The present invention relates to a substrate treatment alkaline aqueous solution composition used for etching or cleaning a substrate. More specifically, it relates to an etching process or a cleaning process using an alkaline aqueous solution, which is used to prevent the The metal impurities adhere to the surface of the substrate and are further cleaned and removed with an alkaline aqueous solution composition for substrate treatment. Background technique In the manufacturing process of silicon wafers for semiconductor manufacturing, when wafers are diced from silicon single crystal ingots and processed to a predetermined thickness, etching is performed with an alkali such as sodium hydroxide or potassium hydroxide in order to achieve uniform etching. At this time, a large amount of metal impurities in sodium hydroxide or potassium hydroxide will be adsorbed on the wafer surface. Usually after etching, it is removed by cleaning with an acid such as dilute...
Claims
the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More Application Information
Patent Timeline
Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): C23F1/32C11D7/32C11D7/06C11D7/60B08B3/04H01L21/02H01L21/302
CPCH01L21/02052H01L21/30608C09K13/02C09K13/00C11D3/044C11D3/26C11D11/0047H01L21/30604
Inventor 石川典夫守田菊惠
Owner KANTO CHEM CO INC
Who we serve
- R&D Engineer
- R&D Manager
- IP Professional
Why Patsnap Eureka
- Industry Leading Data Capabilities
- Powerful AI technology
- Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.
© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com