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Wavefront measurement method and device based on multiple-pinhole plate

A technology of wavefront measurement and pinhole plate, applied in the direction of measuring device, measuring optics, optical radiation measurement, etc., can solve the problems affecting the speed of wavefront measurement, unfavorable application, etc., to simplify the recording process, reduce system cost, and easy to prepare Effect

Inactive Publication Date: 2010-06-09
SHANDONG NORMAL UNIV
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Problems solved by technology

One disadvantage of this technology is that in order to realize the measurement of two-dimensional wavefront, it is necessary to rotate the multi-pinhole plate for multiple recordings, which affects the speed of wavefront measurement and is not conducive to the high-speed dynamic measurement of wavefront in adaptive optics, etc. Applications in the field

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  • Wavefront measurement method and device based on multiple-pinhole plate
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  • Wavefront measurement method and device based on multiple-pinhole plate

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Embodiment Construction

[0041] The present invention will be further described below in conjunction with the accompanying drawings and embodiments.

[0042] like figure 1 As shown, the inventive method comprises the following steps: (1) at first sampling the wavefront of the measured object wave with a multi-pinhole plate 1, the pinholes on this multi-pinhole plate 1 are composed of a reference pinhole 2 and several (2) The object wave passing through the multi-pinhole plate 1 continues to propagate, and forms a Fraunhofer diffraction light field in the far field (or in the back focal plane of the lens after passing through a Fourier transform lens). (3) record the Fraunhofer diffraction intensity pattern of the object wave through the multi-pinhole plate 1 with a two-dimensional image sensor 4 (such as CCD); (4) utilize image processing technology to the Fraunhofer diffraction intensity pattern The pattern is inversely Fourier transformed to obtain the correlation function pattern of the complex am...

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Abstract

The invention discloses wavefront measurement method and device based on a multiple-pinhole plate. The wavefront measurement method comprises the following steps of: irradiating a measured object wave to the multiple-pinhole plate containing one reference pinhole and multiple measurement pinholes; recording an intensity distribution pattern of a Fraunhofer diffraction light field of the object wave transmitting the multiple-pinhole plate by an image sensor, wherein the Fraunhofer diffraction light field is in direct proportion to the Fourier transform of the object wave transmitting the multiple-pinhole plate; carrying out inverse Fourier transform on the recorded intensity distribution pattern, and extracting the function values of points which correspond to the center positions of the measurement pinholes of the multiple-pinhole plate in the inverse Fourier transform pattern, wherein the function values is in direct proportion to the complex amplitude values of the measured object wave on the measurement pinholes; and reproducing an imaged object in a computer by utilizing the complex amplitude values. The invention increases the diffraction imaging speed, has simple structure, convenient regulation and low cost, is suitable for multiple different light sources and can realize the real-time wavefront sensing and the diffraction imaging of a pure-phase object and a plural object or a three-dimensional object.

Description

technical field [0001] The invention relates to a device for measuring the wavefront or complex amplitude distribution of an incident light wave, in particular to a wavefront based on a multi-pinhole plate for recording and reproducing the wavefront or complex amplitude distribution of an incident light wave by using a multi-pinhole plate Measurement methods and devices. Background technique [0002] In the application fields of adaptive optics, optical precision measurement, and microscopic imaging, it is often necessary to measure the wavefront or complex amplitude distribution of light waves. Especially in adaptive optics systems, real-time measurement of wavefront information is required in order to achieve dynamic control of the wavefront. At present, a variety of techniques for measuring the wavefront or complex amplitude distribution of light waves have been developed, such as holographic interferometry, Hartmann wavefront sensing, and phase inversion wavefront measu...

Claims

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Application Information

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IPC IPC(8): G01J9/00G01J9/02G02B27/42
Inventor 国承山张新廷
Owner SHANDONG NORMAL UNIV
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