Chemically mechanical polishing solution and application thereof

A chemical-mechanical, polishing liquid technology, applied in polishing compositions containing abrasives, electrical components, semiconductor/solid-state device manufacturing, etc., can solve the problems of high static corrosion rate, scratches on the surface of the substrate, etc., to improve the degree of depression , the effect of reducing the static corrosion rate

A chemical-mechanical, polishing liquid technology, applied in polishing compositions containing abrasives, electrical components, semiconductor/solid-state device manufacturing, etc., can solve the problems of high static corrosion rate, scratches on the surface of the substrate, etc., to improve the degree of depression , the effect of reducing the static corrosion rate

CN101747844AActive Publication Date: 2010-06-23ANJI MICROELECTRONICS (SHANGHAI) CO LTD

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  • Chemically mechanical polishing solution and application thereof
  • Chemically mechanical polishing solution and application thereof
  • Chemically mechanical polishing solution and application thereof

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1~49

[0025] Table 1 shows Examples 1-49 of the chemical mechanical polishing solution of the present invention. According to the formula given in the table, the other components except the oxidizing agent are mixed evenly, and the mass percentage is made up to 100% with water. with KOH or HNO 3 Adjust to desired pH. Add oxidant before use and mix evenly.

[0026] Table 1 Examples 1-49

[0027]

[0028]

[0029]

[0030]

[0031]

[0032]

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Abstract

The invention discloses a chemically mechanical polishing solution and application thereof. The chemically mechanical polishing solution comprises star polymer containing pigment affinity group, ground granules, complexing agent, oxidant and water. By using the inventive polishing solution, flaws of copper billets can be reduced, partial and entire corrosion of the meal copper can be prevented, and the static corrosion velocity of copper at normal temperature and polishing temperature can be reduced under the condition of maintaining higher copper removal velocity.

Description

technical field [0001] The invention relates to a chemical mechanical polishing liquid and its application. Background technique [0002] With the development of microelectronics technology, the integration of very large scale integrated circuit chips has reached billions of components, and the feature size has entered the nanometer level, which requires hundreds of processes in the microelectronics process, especially multi-layer wiring, Substrates and media must undergo chemical mechanical planarization. VLSI wiring is being transformed from traditional Al to Cu. Compared with Al, Cu wiring has low resistivity, high electromigration resistance, and short RC delay time. The advantages of Cu wiring have made it replace Al as an interconnect metal in semiconductor manufacturing. [0003] However, there is no known technology for effectively plasma etching or wet etching copper material to fully form copper interconnections in integrated circuits, so chemical mechanical poli...

Claims

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Application Information

Patent Timeline
23 Jun 2010
Publication
CN101747844A
IPC
C09G1/02; C23F3/04; C23F3/06
CPC
C23F3/04; C09G1/02; H01L21/3212
Inventors
荆建芬; 蔡鑫元