Chemically mechanical polishing solution and application thereof
A chemical-mechanical, polishing liquid technology, applied in polishing compositions containing abrasives, electrical components, semiconductor/solid-state device manufacturing, etc., can solve the problems of high static corrosion rate, scratches on the surface of the substrate, etc., to improve the degree of depression , the effect of reducing the static corrosion rate
Active Publication Date: 2014-04-16
ANJI MICROELECTRONICS (SHANGHAI) CO LTD
View PDF11 Cites 0 Cited by
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
[0004] The technical problem to be solved by the present invention is to overcome that in the existing chemical mechanical polishing liquid for polishing copper, it is easy to cause scratches on the substrate surface, contamination and excessive removal of copper blocks to produce depressions and copper at room temperature and polishing temperature. The defects with high static corrosion rate provide a way to reduce the depression of copper block after polishing while maintaining a high copper removal rate, prevent local and overall corrosion of metal copper, and reduce copper at room temperature and polishing temperature. Static Etch Rates of Chemical Mechanical Polishing Fluids and Their Applications
Method used
the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View moreImage
Smart Image Click on the blue labels to locate them in the text.
Smart ImageViewing Examples
Examples
Experimental program
Comparison scheme
Effect test
Embodiment 1~49
[0025] Table 1 shows Examples 1-49 of the chemical mechanical polishing solution of the present invention. According to the formula given in the table, the other components except the oxidizing agent are mixed evenly, and the mass percentage is made up to 100% with water. with KOH or HNO 3 Adjust to desired pH. Add oxidant before use and mix evenly.
[0026] Table 1 Examples 1-49
[0027]
[0028]
[0029]
[0030]
[0031]
[0032]
the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more PUM
Property | Measurement | Unit |
---|---|---|
particle diameter | aaaaa | aaaaa |
Login to view more
Abstract
A chemical-mechanical polishing liquid and the use thereof are provided. The polishing liquid comprises a star polymer containing pigment-affinity group, abrasive particles, a complexing agent, an oxidant and water. While a relatively high removal rate of copper can be kept by applying the polishing liquid, dishing of a polished copper block can be reduced, partial and integral corrosion of the metal copper can be prevented, and the static corrosion rate of copper at room temperature and at polishing temperature can be reduced.
Description
technical field [0001] The invention relates to a chemical mechanical polishing liquid and its application. Background technique [0002] With the development of microelectronics technology, the integration of very large scale integrated circuit chips has reached billions of components, and the feature size has entered the nanometer level, which requires hundreds of processes in the microelectronics process, especially multi-layer wiring, Substrates and media must undergo chemical mechanical planarization. VLSI wiring is being transformed from traditional Al to Cu. Compared with Al, Cu wiring has low resistivity, high electromigration resistance, and short RC delay time. The advantages of Cu wiring have made it replace Al as an interconnect metal in semiconductor manufacturing. [0003] However, there is no known technology for effectively plasma etching or wet etching copper material to fully form copper interconnections in integrated circuits, so chemical mechanical poli...
Claims
the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more Application Information
Patent Timeline
![application no application](https://static-eureka.patsnap.com/ssr/23.2.0/_nuxt/application.06fe782c.png)
Patent Type & Authority Patents(China)
IPC IPC(8): C09G1/02C23F3/04C23F3/06
CPCC09G1/02H01L21/3212C23F3/04
Inventor 荆建芬蔡鑫元
Owner ANJI MICROELECTRONICS (SHANGHAI) CO LTD
Who we serve
- R&D Engineer
- R&D Manager
- IP Professional
Why Eureka
- Industry Leading Data Capabilities
- Powerful AI technology
- Patent DNA Extraction
Social media
Try Eureka
Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic.
© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap