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Double-PZT symmetrical integrated large-strain loading device

A loading device and large strain technology, applied in scanning probe technology, instruments, etc., can solve the problems of single load, unfavorable experimental research, large movement of microscope observation position, etc.

Inactive Publication Date: 2013-04-10
TIANJIN UNIV
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0025] Disadvantages: 1. Single load
[0026] 2. Single buckling shape
After coating, each specimen can only obtain the buckling shape under one strain value, and the buckling shape cannot be changed during the experiment
[0027] 3. The effect of pre-strain on film buckling is uncontrollable
[0029] Disadvantage: the movement of the microscope observation position is too large
When loaded, the observation position of the microscope will move with the change of the load, even beyond the observation range of the field of view, which is not conducive to experimental research

Method used

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  • Double-PZT symmetrical integrated large-strain loading device
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  • Double-PZT symmetrical integrated large-strain loading device

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Experimental program
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Effect test

Embodiment Construction

[0054] When a voltage is applied to the piezoelectric ceramic (PZT), the PZT expands due to the inverse piezoelectric effect, and then pushes the clamp to produce a micro-displacement. Utilizing this principle, two strictly paired PZTs are used to load both sides of the specimen at the same time, so that the position of the specimen will not change under different working conditions, thus ensuring the realization of in-situ observation . The loading device has symmetrical loading, automatic load control and collection. The device has the following ingenuity.

[0055] Application of large load: The device has a large load application range and high load capacity. A large load can be applied to the film base specimen to generate a large strain according to the time, which is beneficial to observe the buckling performance of the film under the condition of large strain.

[0056] Symmetrical loading: controlled by two paired PZTs. When the same voltage is applied, the displacem...

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Abstract

The invention relates to the mechanics measurement and the experimental mechanics of the micro-nano structure, in particular to a double-PZT symmetrical integrated large-strain loading device. The double-PZT symmetrical integrated large-strain loading device adopts the following technical scheme that: the double-PZT symmetrical integrated large-strain loading device comprises a pair of piezoelectric ceramics PZT with the identical technical indexes, a pressure sensor, a quasi-static charge amplifier and a computer, wherein the piezoelectric ceramics PZT are arranged on both sides of a test piece for pushing a clamp to generate micrometric displacement and realize simultaneous loading on the both sides of the test piece; the pressure sensor is connected with the computer through the quasi-static charge amplifier; and the pressure sensor is a piezoelectric type force sensor. The double-PZT symmetrical integrated large-strain loading device is mainly used on the occasion where researchesare carried out on the performance of the thin film loaded with heavy load.

Description

technical field [0001] The invention relates to mechanical detection and experimental mechanics of micro-nano structures, in particular to a double-PZT symmetrically integrated large-strain loading device. Background technique [0002] Nanotechnology is a new science developed from the late 1980s and early 1990s. It has attracted great attention both at home and abroad, especially in nanomaterials. [0003] The significance of nanotechnology will first of all promote the revolution of human cognition, and at the same time trigger a new industrial revolution, which will have a major impact on our country's society, economy and national security. [0004] The design, development and performance research of nanomaterials are the basis of high-tech development. Mechanical and thermal properties are the main indicators to evaluate the quality of nanomaterials, and also the main basis for the design and calculation of nanostructures. In recent years, with the improvement of mate...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01Q30/02
Inventor 王世斌李林安刘鸣王志勇贾海坤
Owner TIANJIN UNIV
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