Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Method for accurately obtaining antenna radiating gap active admittance of planar slotted array

An array antenna and flat panel technology, which is applied in the field of extracting the active admittance of the radiation seam of the flat panel slit array antenna, can solve the problems of huge time, slow calculation speed, and large amount of calculation, and achieve accurate calculation results, accurate average values, and improved efficiency effect

Inactive Publication Date: 2010-08-11
10TH RES INST OF CETC
View PDF0 Cites 11 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

The three design equations [1~3] proposed by Elliott for planar slot antennas are common methods for extracting active admittance to design planar slot array antennas, but this method is based on the solution of equations. increase, the number of equations increases by 2 times the number of gaps, and the equation contains double integrals, which makes the calculation speed slower, especially in large gap arrays, the amount of calculation is very large, and the time used for calculation is also huge
With the development of computers, electromagnetic simulation software such as HFSS can extract the active admittance of the slot in the array by building a model, but this method can only extract the admittance value of the waveguide port, and then obtain the active admittance of the slot on the waveguide The average value, in fact, the gaps at different positions on the same waveguide have different active admittances due to different coupling effects, so the active admittance extracted by this method is an approximate value
In addition, the method of moments can be used to extract the active admittance of the gap in the traveling wave waveguide crack array[4], but the active admittance of the gap in the standing wave array is not mentioned, and when the method of moments is calculated, the gap's The end is a square head, but the actual processed gap is a round head, so it is necessary to determine the equivalent relationship between the two. There is no report on the exact determination of this equivalent relationship in the existing literature.

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Method for accurately obtaining antenna radiating gap active admittance of planar slotted array
  • Method for accurately obtaining antenna radiating gap active admittance of planar slotted array
  • Method for accurately obtaining antenna radiating gap active admittance of planar slotted array

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0016] exist figure 2 In the equivalent circuit diagram of a slot on a certain waveguide of the planar slot array antenna array shown, the standing wave array is taken as y l =0. According to the field distribution at the gap obtained in (1), the forward scattering coefficient Γ at the mth gap can be obtained m and the backscatter coefficient T m , both of which include the effect of the mirror image gap equivalent by the short-circuit plane. According to the transmission line theory, the slot voltage of the mth slot is:

[0017] V m = ( 1 + Σ i = 1 m - 1 T i ) e - j θ m + ...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention provides a method for accurately obtaining antenna radiating gap active admittance of a planar slotted array. The method has high obvious admittance extracting efficiency and accurately obtains the active admittance of each gap of an antenna array. The method comprises the following steps of: (1) analyzing and calculating the field distribution of a planar slotted array radiating gap by using a moment vector method, establishing field equations on the upper surface and the lower surface of the gap according to the continuity of a magnetic field, converting an integral equation into a matrix form by using a Rooftop primary function and a pulse verifying function and solving the equation to obtain the distribution condition of the field in the gap position; (2) obtaining the active admittance of the gap by a forward and backward scattered field in the gap position; (3) respectively carrying out simulating analysis on square and circular gaps by adopting HFSS (High Frequency Structure Simulator) software, obtaining an equivalent relation between the square gap and the circular gap, and solving the length correction factor c between the square gap and the circular gap by the following relational expression; and (4) correcting the circular gap length which corresponds to the active admittance and is calculated by using the moment vector method by the solved correction factor c.

Description

technical field [0001] The invention relates to a method for extracting the active admittance of the radiation slot of the plate slot array antenna. Background technique [0002] The extraction of the active admittance of the radiating slot of the planar slot array antenna can provide accurate basic data for the design of high performance planar slot array antenna. The accuracy of this basic data is the key to the design of high-performance planar slot antennas. The three design equations [1~3] proposed by Elliott for planar slot antennas are common methods for extracting active admittance to design planar slot array antennas, but this method is based on the solution of equations. Increase, the number of equations increases by 2 times the number of gaps, and the equations contain double integrals, which makes the calculation speed slower, especially in large gap arrays, the amount of calculation is very large, and the time used for calculation is also huge. With the develo...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): H01Q13/10H01Q21/00G01R29/00
Inventor 魏旭何海丹杨顺平李秀梅
Owner 10TH RES INST OF CETC
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products