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Method and device for testing SPI (Serial Peripheral Interface) control chip

A control chip and PC technology, which is applied in the field of testing SPI control chips, can solve the problems of high hardware cost, high probability of failure, and inflexible and convenient application, so as to improve flexibility and safety and reduce hardware cost Effect

Inactive Publication Date: 2012-07-04
广州市广晟微电子有限公司
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0009] (1) It is necessary to use a single-chip microcomputer as the controller of the SPI bus, and a single-chip microcomputer circuit board is required, the hardware cost is high, and the probability of failure is also high
[0010] (2) The modification of the chip configuration information in the PC software is limited, and the configuration of the register needs to be modified and regenerated. Therefore, the application is not flexible enough.

Method used

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  • Method and device for testing SPI (Serial Peripheral Interface) control chip
  • Method and device for testing SPI (Serial Peripheral Interface) control chip
  • Method and device for testing SPI (Serial Peripheral Interface) control chip

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Embodiment Construction

[0044] In order to enable those skilled in the art to better understand the solutions of the embodiments of the present invention, the embodiments of the present invention will be further described in detail below in conjunction with the drawings and implementations.

[0045] The method and device for testing the SPI control chip in the embodiment of the present invention, when testing the SPI control chip in the prior art, use a single-chip microcomputer as the controller of the SPI bus, so that the hardware cost is high and the application is not flexible enough. The parallel port of the computer simulates the SPI serial interface to realize the test of the SPI control chip, which can greatly reduce the hardware cost and improve the flexibility and security of the application.

[0046] Such as figure 2 Shown is the flow chart of the method for testing the SPI control chip in the embodiment of the present invention, comprising the following steps:

[0047] Step 201, select ...

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Abstract

The invention relates to the technical field of chip tests, and discloses a method and a device for testing an SPI (Serial Peripheral Interface) control chip. The method comprises the following steps of: selecting three different print output ends of the parallel port of a PC(Personal Computer) as the clock end, the chip selection end and the data input end of the SPI control chip, and selecting a print input end of the parallel port of the PC as the data output end of the SPI control chip; and simulating an SPI by utilizing the selected input end and output end of the parallel port of the PC, and testing the SPI control chip. By using the invention, the hardware cost is greatly lowered, and the application flexibility is improved.

Description

technical field [0001] The invention relates to the technical field of chip testing, in particular to a method and device for testing an SPI (Serial Peripheral Interface, Serial Peripheral Interface) control chip. Background technique [0002] SPI is a serial synchronous communication protocol interface, which consists of a master device and one or more slave devices. The master device initiates a synchronous communication with the slave device to complete the data exchange. SPI includes four signals: SDI (serial data input), SDO (serial data output), SCK (serial shift clock), and CS (slave enable signal), among which CS determines the only communication with the master device from the device. During communication, the data is output by SDO at the rising or falling edge of the clock, and input by SDI at the next falling or rising edge, so that after a certain number of clock changes, the data transmission of the corresponding data length is completed. In SPI transfers, dat...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G06F11/36G01R31/28
Inventor 李俊鸿郑卫国叶晖
Owner 广州市广晟微电子有限公司
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