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Fast image splicing method

An image stitching and image technology, applied in image enhancement, image analysis, image data processing and other directions, can solve the problems of poor light interference effect, unsuitable image stitching, complex algorithm, etc., achieve fast and accurate overlapping position registration, reduce Computational complexity, the effect of accurate splicing

Inactive Publication Date: 2010-09-22
GUANGDONG UNIV OF TECH
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Problems solved by technology

[0006] For the traditional image stitching algorithm, the effect of dealing with light interference is not good, and the algorithm is complex, which is not suitable for image stitching in AOI

Method used

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Embodiment Construction

[0024] The present invention is a fast image stitching method, such as figure 1 shown, including the following steps:

[0025] (1) Obtain a single field of view image;

[0026] (2) Extract feature information in the image to be stitched;

[0027] (3) Perform two-dimensional wavelet transform on the image to be stitched to obtain high-frequency coefficients reflecting the horizontal and vertical variation profile of the image, and then combine the phase correlation method to achieve overlapping position registration;

[0028] (4) The weighted average method is used to fuse the overlapping regions of the images to complete the splicing.

[0029] The key is image registration and image fusion. The following two aspects are explained in detail:

[0030] 1. Image registration:

[0031] Image registration is based on the contour of the image, and the high-frequency coefficients of wavelet decomposition just reflect the changing contour of the image. In the engineering practice ...

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Abstract

The invention discloses a fast image splicing method, which is characterized by comprising the following steps of: (1) acquiring a single-breadth field image; (2) extracting characteristic information in an image to be spliced; (3) performing two-dimensional wavelet transform on the image to be spliced to obtain high-frequency coefficients reflecting the profile of change in a horizontal direction and a vertical direction of the image, and realizing overlapped position alignment in combination with a phase correlation method; and (4) adopting a weighted mean method to fuse overlapped areas of the image to finish the splicing. In the method, low-energy coefficients reflecting the gradual change of illumination are removed by performing the two-dimensional wavelet transform on the image and then the high-frequency coefficients reflecting the profile of the change in the horizontal direction and the vertical direction of the image are obtained, which can effectively reduce calculation complexity; and simultaneously, the fast and accurate overlapped position alignment is realized in combination with the phase correlation method and the fusion of the image is realized by adopting the weighted mean method so as to realize the fast and accurate splicing of PCB images of various specifications and various colors.

Description

technical field [0001] The invention belongs to a graphics processing method, in particular to a fast image splicing method based on two-dimensional wavelet transform. It can be applied to image mosaic in automatic optical inspection system of mounted PCB. Background technique [0002] With the development of science and technology, image stitching has become a very important technology in the field of image information processing. Image mosaic technology is based on the overlapping parts of images to stitch together multiple concatenated images into a high-resolution panorama. At present, image stitching technology is widely used in digital video, motion analysis, virtual reality technology, medical image analysis, remote sensing image processing and other fields, and there are not many image stitching problems in AOI (Automatic Optical Inspection). Image stitching includes two parts: image registration of overlapping parts and image fusion at seams. The core and key of ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06T5/50G06T7/00
Inventor 程良伦衷柳生赖宇峰陈伟陈聪传
Owner GUANGDONG UNIV OF TECH
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