Organic semiconductor device characteristic measuring instrument
A technology of organic semiconductors and inorganic semiconductors, applied in the direction of single semiconductor device testing, measuring devices, measuring electrical variables, etc., can solve problems such as insufficient output voltage
Inactive Publication Date: 2010-11-10
LANZHOU UNIVERSITY
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[0002] In recent years, the research on organic semiconductor devices has been extensively developed. Some devices, such as organic electroluminescent devices, have entered the stage of commercial production. For organic semiconductor devices, the measurement equipment of inorganic semiconductor devices is still used, which has many inconveniences, such as insufficient output voltage. Wait
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[0006] The object of the present invention is achieved by the following measures:
[0007] (1) The organic semiconductor device measuring instrument consists of thirteen parts, such as figure 1 shown. They are respectively a data acquisition card group, three high output voltage DC amplifiers, three automatic magnification adjustment amplifier circuits, three current amplifier circuits and three program-controlled current limiting circuits;
[0008] (2) The data acquisition card group consists of one or more data acquisition cards based on PCI, PC, RS232 or UBS bus. The data acquisition card set based on PCI and PC bus is directly inserted into the PCI or ESA slot on the computer motherboard to connect the measuring instrument with the computer in parallel, while the data acquisition card set based on RS232 or USB bus is connected through RS232 or USB interface Serial connection with computer;
[0009] (3) The high output voltage DC amplifier circuit can output a DC voltage...
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The organic semiconductor devices have been widely researched, and instruments designed for inorganic semiconductor devices are mostly used for measuring the characteristic curves of the organic semiconductor devices. Compared with the inorganic semiconductor devices, the organic semiconductor devices have high working voltage, and have more varieties of parameters due to more complex working mechanisms. Therefore, the conventional measuring instruments are high in price and not convenient. The invention relates to an organic semiconductor device measuring instrument, which comprises a data acquisition board assembly, a high output voltage DC amplifying circuit, a current amplifying circuit, an amplification factor automatic adjustment and voltage amplifying circuit and a programmed current-limiting circuit. The measuring instrument is suitable for organic semiconductor devices and also suitable for measuring traditional inorganic semiconductor devices.
Description
1. Technical field [0001] The invention relates to a measurement system for measuring parameters of semiconductor devices, belonging to the technical field of electronic measurement. The invention is suitable for the measurement of parameters of organic semiconductor devices such as organic triodes and organic diodes in scientific research and industrial production, and is also suitable for the measurement of corresponding inorganic semiconductor devices. 2. Technical background [0002] In recent years, the research on organic semiconductor devices has been extensively developed. Some devices, such as organic electroluminescent devices, have entered the stage of commercial production. For organic semiconductor devices, the measurement equipment of inorganic semiconductor devices is still used, which has many inconveniences, such as insufficient output voltage. Wait. 3. Contents of the invention [0003] The object of the present invention is to provide an instrument for ...
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IPC IPC(8): G01R31/26G01R19/00
Inventor 彭应全王颖
Owner LANZHOU UNIVERSITY