Embedded software reliability accelerated test method
Patent Information
- Authority / Receiving Office
- CN ยท China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- BEIHANG UNIV
- Publication Date
- 2010-11-24
- Estimated Expiration
- Not applicable ยท inactive patent
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Abstract
Description
Technical field
[0001] The invention relates to the field of software reliability testing, in particular to an embedded software reliability accelerated testing method based on software task profile. Background technique
[0002] At present, embedded software is widely used in various fields such as aerospace, finance, medical treatment, and telecommunications. With the development of applications, the reliability of embedded software has become the focus of attention. Software reliability testing is an effective way to achieve software reliability growth and to evaluate software reliability.
[0003] However, from the perspective of testing, due to the real-time and response characteristics of embedded software itself, the input of embedded software is restricted by many conditions such as value size, timing, and time response. The input conditions are very complicated and almost impossible to cover. To all possible input conditions of the software; on the other hand, compared w...