Clock margin measuring system, method and corresponding device

Abstract

The invention discloses a clock margin measuring system, a clock margin measuring method and a corresponding device. The device comprises a clock margin regulation module and a clock output unit, which are connected mutually, wherein the clock margin regulation module receives an input clock signal, regulates the reference level and / or amplitude of the input clock signal and outputs the signal; and the clock output unit joints and matches the clock signal output by the clock margin regulation module and outputs a jointed and matched clock signal. In the invention, the driving clock amplitude corresponding to a clock system is modified for enabling a test system to test the functions and performance of different products, the concrete value of the working clock amplitude margin of the clock system is acquired, and thus, the functions and performance of the tested products can be tested.

Description

technical field [0001] The invention relates to product testing technology, in particular to a clock margin testing system, method and corresponding device for product testing. Background technique [0002] With the continuous deepening of circuit hardware testing, people not only need to ensure the correct implementation of the designed product functions and excellent performance through testing, but also do some margin testing to obtain the specific performance indicators of the product, so that it can be used as much as possible. Have a comprehensive understanding of the designed product. At the same time, margin testing is also of great help to product material selection, product maintenance, and troubleshooting of fault recurrence. In the current situation of fierce competition in the market, product developers should not only care about the function of the product, but also compete with the performance of the product under the same product function, so that the limit ...

AI Technical Summary

Problems solved by technology

Therefore, to test the performance of various products, the test system is inseparable from the test and adjustment of the synchronous clock margin, because if the drive clock of the product exceeds this margin, it may directly cause a certain function of the product to fail to be realized, or cause the product to fail. performance of

[0004] Currently, disclosures about clock phase margin testing technology can be seen in terms of clock margin testing and adjustment, but no related technical reports have been seen in terms of clock amplitude margin testing and adjustment

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