Double-slit convex grating imaging spectrometer

An imaging spectrometer and convex grating technology, applied in the field of systems and optical components, can solve the problem of high frame rate of the instrument, and achieve the effect of improving spectral bending

Inactive Publication Date: 2011-02-16
SHANGHAI INST OF TECHNICAL PHYSICS - CHINESE ACAD OF SCI
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Problems solved by technology

The purpose of the present invention is to set double slits in the object space by expanding the field of view, so that different positions in the image space can form the respective spectral planes of the corresponding slits, and multiple detector modules can be arranged alternately to eliminate splicing gaps and image loss, and By adjusting the spatial position of the detector, the imaging quality and spectral bending can be improved; double-slit spectral imaging can also be formed on the same detector, and the readout frame rate of the detector can be doubled to solve the problem of high-speed flying aerospace vehicles. Problem with high frame rate

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[0012] Attached according to the present invention figure 1 With the structure of the optical system shown, we have designed a pair of slit imaging spectrometers. The specifications of the spectrometer are as follows:

[0013] Working band: 1.0μm~2.5μm

[0014] System F number: F / 3.0;

[0015] Object space slit length: 60mm

[0016] Spectral resolution: 312nm / mm

[0017] In the object space of the double-slit imaging spectrometer, the off-axis distance of slit 1 is 75mm, and the slit size is 60mm×0.03mm; the off-axis distance of slit 2 is 57mm, and the size is 60mm×0.03mm; the distance between the double slits The off-axis distance of slit 1 corresponding to spectrum 6 is -80.6mm, and the size is 60mm×4.8mm; the off-axis distance of slot 2 corresponding to spectrum 7 is -62.6mm, and the dimension is 60mm×4.8mm.

[0018] The detectors of the system can be selected as follows:

[0019] a) Select a single 2048×1024 short-wave infrared MCT detector with a pixel size of 30μm×3...

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Abstract

The invention discloses a satellite borne or airborne double-slit convex grating imaging spectrometer for observation over the ground, which is composed of a reflection lens, a convex spherical reflection grating and a concave spherical reflector. The invention is characterized in that spectral surfaces respectively corresponding to slits are formed on different positions of an image space by setting two slits in an object space, a plurality of detector modules can be arranged alternately on the spectral surface so as to expand the field of view, and the image quality and the spectral bending can be improved by carrying out spatial position adjustment on a plurality of detectors; and a double-slit spectral imaging can also be formed on the same detector so as to reduce half of the requirement for reading frame frequencies by the detector, thereby solving the problem that the instruments in aerospace vehicles flying at high speed are extra-high in frame frequency. The invention is mainly applied to satellite borne or airborne spectral imaging systems.

Description

technical field [0001] The invention relates to optical components and systems, in particular to a double-slit convex grating imaging spectrometer used in an airborne or space-borne hyperspectral imager for ground observation. Background technique [0002] The current common convex imaging spectrometer generally adopts the OFFNER structure, and a single slit is placed in the object space. For example, in the patent CN1391090A, in the catadioptric concave grating imaging optical system proposed by Shen Beijun et al., a single slit is placed in the object space, the field of view in the meridian direction belongs to the line field of view, and the focal plane device is placed in the image side to receive the light from the slit Imaging in spatial and spectral dimensions. In the patent US2003 / 0067600A1, Brian Curtiss et al. proposed a single spectrometer multi-input method and system. The spectrometer is a concave grating for measuring light intensity, and multi-input is reali...

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01J3/12G01J3/28
Inventor 刘银年丁学专杨波刘成林刘书锋薛永祺
Owner SHANGHAI INST OF TECHNICAL PHYSICS - CHINESE ACAD OF SCI
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