Field programmable gate array (FPGA)-based final test (FT) method of liquid crystal display controller (LCDC) module

Abstract

The invention provides a field programmable gate array (FPGA)-based final test (FT) method of a liquid crystal display controller (LCDC) module, which is characterized in that a VIP acquisition module is designed in an FPGA, wherein the VIP acquisition module is used for acquiring data sent by the LCDC module; according to time sequence of the LCDC module and V_BP, V_FP, V_VD, H_BP, H_FP and H_VD parameters of a screen, a count 1 and a count 2 are designed, wherein the count 1 starts counting at the frequency of DOTCLK, and the count 2 starts to count at the frequency of horizontal synchronization signal (HSYNC), the operation is repeated until the LCDC module does not send out the data, which shows the end of the sampling; and finally exporting the acquired data to a file and comparing the acquired data with a data file sent by a memorizer. By using the FPGA-based FT test method of the LCDC module of the invention, any digital circuit can be flexibly realized, interference of analog signals can be eliminated, restriction of special chips can be reduced, and the FT test of chips to be tested can be assisted.

Description

【Technical field】 [0001] The invention relates to a chip testing technology, in particular to an FT testing method of an FPGA-based LCDC module. 【Background technique】 [0002] The test after IC packaging and before leaving the factory is FT (final test) test. FT tests include LCDC, VIP, I 2 S and other modules of the test. [0003] LCDC module: LCD_Controler (LCD controller) referred to as LCDC, it is a driver that controls the data information in the memory to be displayed on the LCD screen. LCDs physically consist of glass, drivers and controllers. Logically, the lines are composed of pixels, and the lines form a plane, depending on the chromaticity and brightness (or RGB value) of each point. Generally, the driver drives each pixel one by one at a speed of about 50HZ to present one or another beautiful or beautiful scene. Not a pretty picture. The driver's chromaticity and brightness information are obtained from the controller. [0004] The test method of the LCDC...

AI Technical Summary

Problems solved by technology

[0005] The shortcoming of the prior art test method is that when there is a problem in any part of the LCDC or VIP module, it is impossible to test whether the function of another module is correct

That is to say, if the function of the VIP module is abnormal, it is impossible to test whether the function of the LCDC module is normal; conversely, when the function of the LCDC module is abnormal, it is also impossible to test whether the function of the VIP module is normal, so that the final test yield of the chip will be greatly affected. influences

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