Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Infared nonuniformity correction method for removing temperature shift

A non-uniformity correction and temperature drift technology, applied in radiation pyrometry, measuring devices, instruments, etc., can solve problems such as gain correction, and achieve the effect of improving uniformity, eliminating residual non-uniformity, and simple principle

Inactive Publication Date: 2011-05-04
UNIV OF ELECTRONIC SCI & TECH OF CHINA
View PDF0 Cites 59 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0022] The essence of one-point correction is only to compensate the dark current of the device, but not to correct the gain. We only use one-point correction to compensate the bias of the output signal.

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Infared nonuniformity correction method for removing temperature shift
  • Infared nonuniformity correction method for removing temperature shift
  • Infared nonuniformity correction method for removing temperature shift

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0066] The present invention will be further described below in conjunction with accompanying drawing:

[0067] Detailed technical scheme of the present invention is:

[0068] An infrared non-uniformity correction method that removes temperature drift. The two-point algorithm compensates both the offset and the gain. Sometimes the focal plane array will cause temperature drift after a period of operation. At this time, a little correction can correct the offset. Set the coefficient to compensate.

[0069] The correction of the non-uniformity of the infrared focal plane can be realized by a separate FPGA, and the separate FPGA correction circuit has the advantages of being simple and easy to control. The hardware part of its correction system mainly consists of five parts: detector, FPGA, analog-to-digital conversion, external memory, and terminal display.

[0070] Since the non-uniformity correction mainly needs adding (subtracting) and multipliers, and the selected FPGA con...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses an infared nonuniformity correction method for removing temperature shift. In the method, the correction gain and offset of a two-point correction algorithm are solved first, and then correction offset of a one-point correction algorithm is solved; and image data during the solving of offset parameters of the one-point correction algorithm is from the data solved after two-point correction. The method has the advantages of low cost, wide correction dynamic range, good effect, and simple principle and the characteristics of high efficiency, accuracy and the like, can be easily implemented in the aspect of hardware, and is suitable to be used in a focal plane imaging system. The technology is technical improvement on uniformity of an infared focal plane and contributes to promoting the good performance of an infared focal plane system.

Description

technical field [0001] The invention relates to the technical field of uncooled infrared detection, in particular to an infrared non-uniformity correction method for removing temperature drift. Background technique [0002] Infrared focal plane arrays were developed in the late 1970s and early 1980s, driven by defense applications and other strategic and tactical applications. It is an important optoelectronic device to obtain the infrared thermal radiation information of the scene. In addition to being used in traditional military imaging, it is also widely used in industrial automation, medical diagnosis, chemical process monitoring, infrared astronomy and other fields. [0003] Infrared detectors are the most active field of infrared detection technology development, and are an important part of infrared thermal imaging systems. At present, relatively mature photon-type infrared detectors have been widely used in the fields of communication, medicine, military and indus...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
IPC IPC(8): G01J5/02
Inventor 刘子骥蒋亚东王然姜宇鹏袁凯
Owner UNIV OF ELECTRONIC SCI & TECH OF CHINA
Features
  • Generate Ideas
  • Intellectual Property
  • Life Sciences
  • Materials
  • Tech Scout
Why Patsnap Eureka
  • Unparalleled Data Quality
  • Higher Quality Content
  • 60% Fewer Hallucinations
Social media
Patsnap Eureka Blog
Learn More

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2025 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com