Infared nonuniformity correction method for removing temperature shift

A non-uniformity correction and temperature drift technology, applied in radiation pyrometry, measuring devices, instruments, etc., can solve problems such as gain correction, and achieve the effect of improving uniformity, eliminating residual non-uniformity, and simple principle

Inactive Publication Date: 2011-05-04
UNIV OF ELECTRONIC SCI & TECH OF CHINA
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[0022] The essence of one-point correction is only to compensate the dark current of the device, but

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  • Infared nonuniformity correction method for removing temperature shift
  • Infared nonuniformity correction method for removing temperature shift
  • Infared nonuniformity correction method for removing temperature shift

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[0066] The present invention will be further described below in conjunction with accompanying drawing:

[0067] Detailed technical scheme of the present invention is:

[0068] An infrared non-uniformity correction method that removes temperature drift. The two-point algorithm compensates both the offset and the gain. Sometimes the focal plane array will cause temperature drift after a period of operation. At this time, a little correction can correct the offset. Set the coefficient to compensate.

[0069] The correction of the non-uniformity of the infrared focal plane can be realized by a separate FPGA, and the separate FPGA correction circuit has the advantages of being simple and easy to control. The hardware part of its correction system mainly consists of five parts: detector, FPGA, analog-to-digital conversion, external memory, and terminal display.

[0070] Since the non-uniformity correction mainly needs adding (subtracting) and multipliers, and the selected FPGA con...

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Abstract

The invention discloses an infared nonuniformity correction method for removing temperature shift. In the method, the correction gain and offset of a two-point correction algorithm are solved first, and then correction offset of a one-point correction algorithm is solved; and image data during the solving of offset parameters of the one-point correction algorithm is from the data solved after two-point correction. The method has the advantages of low cost, wide correction dynamic range, good effect, and simple principle and the characteristics of high efficiency, accuracy and the like, can be easily implemented in the aspect of hardware, and is suitable to be used in a focal plane imaging system. The technology is technical improvement on uniformity of an infared focal plane and contributes to promoting the good performance of an infared focal plane system.

Description

technical field [0001] The invention relates to the technical field of uncooled infrared detection, in particular to an infrared non-uniformity correction method for removing temperature drift. Background technique [0002] Infrared focal plane arrays were developed in the late 1970s and early 1980s, driven by defense applications and other strategic and tactical applications. It is an important optoelectronic device to obtain the infrared thermal radiation information of the scene. In addition to being used in traditional military imaging, it is also widely used in industrial automation, medical diagnosis, chemical process monitoring, infrared astronomy and other fields. [0003] Infrared detectors are the most active field of infrared detection technology development, and are an important part of infrared thermal imaging systems. At present, relatively mature photon-type infrared detectors have been widely used in the fields of communication, medicine, military and indus...

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Application Information

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IPC IPC(8): G01J5/02
Inventor 刘子骥蒋亚东王然姜宇鹏袁凯
Owner UNIV OF ELECTRONIC SCI & TECH OF CHINA
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