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Test system and test method for computer device without storage device

A technology for computer devices and storage devices, applied in the direction of detecting faulty computer hardware, etc., can solve problems such as slow startup speed, poor peripheral device support, slow system operation, etc., and achieve the effect of improving test efficiency.

Inactive Publication Date: 2011-05-11
INVENTEC CORP
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

The first type: DOS startup speed is fast, hardware device access speed is fast, but the support for peripheral devices is poor
Type 2: Advantages of Windows: widely used, most supported by hardware manufacturers, rich in drivers, but its disadvantage is that the startup speed is slow
Type 3: The advantage of Linux is that the open architecture enables self-definition of test items, and there is no strict hardware access control to facilitate hardware testing, but its disadvantage is that the startup speed is slow, and the software environment on many basic input / output systems will inevitably affect hardware access speed
In addition, too many system drivers and background services cause the system to run slowly, and limited hardware drivers make it impossible to test some hardware devices. Too many versions are not conducive to the unification of the test platform

Method used

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  • Test system and test method for computer device without storage device
  • Test system and test method for computer device without storage device
  • Test system and test method for computer device without storage device

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Embodiment Construction

[0024] Below in conjunction with accompanying drawing, structural principle and working principle of the present invention are specifically described:

[0025] Please refer to Figure 1A As shown, it is a schematic diagram of the structure of the present invention. The present invention is applied to computer devices without storage devices. The present invention includes: a server 110 and a client 120 . The server 110 has multiple EFI test files 111 . The Extensible Firmware Interface (Extensible Firmware Interface) is a hardware platform boot system used to replace the Basic Input / Output System (BIOS), but it is higher-level than the Basic Input / Output System and has more operational features. The characteristics of the system. please cooperate Figure 1B As shown, it is a schematic diagram of the EFI architecture of the present invention. exist Figure 1B The top is the operating system loader (OS Loader). EFI is used to communicate the operation of the operating sys...

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PUM

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Abstract

The invention discloses a test system and test method for a computer device without a storage device, and the system and method provided by the invention are used for testing peripheral devices on the computer device without the storage device. The test system comprises a server and a client, wherein the server is provided with a plurality of extensible firmware interface (EFI) test files; and the client comprises a network communication module, a processing unit and a memory; relevant network communication is established between the network communication module and the server; the processing unit is electrically connected with the network communication module; when the client is started up, the processing unit sends a test request to the server; the server calls the EFI test files and then transmits the EFI test files to the client; and the processing unit divides the memory into virtual disks, and stores the EFI test files into the virtual disks so as to operate the EFI test files to test the client.

Description

technical field [0001] The invention relates to a testing system and method for computer devices, in particular to a testing system and testing method for computer devices without storage equipment. Background technique [0002] With the rapid development of science and technology, the computing power of computer devices is also increased. In order to ensure the quality of the computer device, the manufacturer will test the related peripheral devices before the computer device leaves the factory. [0003] Generally speaking, the testing of computer devices is divided into two parts: a semi-finished product testing phase and a finished product testing phase. The main purpose of the semi-finished product testing stage is to place the main board on the test machine to test its basic functions after the main board is manufactured. [0004] At this time, the functional components inserted on the motherboard: central processing unit, memory, hard disk and other equipment are all...

Claims

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Application Information

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IPC IPC(8): G06F11/22
Inventor 王凯陈玄同
Owner INVENTEC CORP
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