Test interface card and test method
A technology of test interface and test method, which is applied in the direction of error detection/correction, instrumentation, electrical digital data processing, etc., can solve the problems of increasing test time cost, waste of resources, excessive disassembly time, etc., and achieve the effect of saving test time
Inactive Publication Date: 2014-05-07
WISTRON CORP
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[0006] However, the known test method is to replace the SAS interface card that meets the specification for the bus with different specifications. That is to say, when the bus specifications to be tested are more, the number of disassembly is more, thus causing excessive disassembly time. Increase the time cost of testing
also, figure 1 It is tested for PCI-E bus 910 and SAS bus 920; figure 2 It is tested for the SATA bus 930 and the SAS bus 920, therefore, it can be found that the SAS bus 920 is repeatedly tested, resulting in a waste of resources
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[0041] The aforementioned and other technical contents, features and effects of the present invention will be clearly presented in the following detailed description of four preferred embodiments with reference to the drawings.
[0042] refer to image 3 , is the first preferred embodiment of the test interface card 100 of the present invention, the test interface card 100 is used between the signal conversion interface cards 300 of the board 200 to be tested, and the circuit design of the bus makes the board 200 to be tested capable of All the buses are tested at one time without having to replace the signal conversion interface card 300 and test many times, so as to reduce the time cost of the test.
[0043] In this embodiment, the test board 200 is a blade server and includes a test module 21 and a storage module 22 , but it is not limited thereto. The test module 21 is an ICH9 chip, which has a first specification interface controller 211 and a second specification interf...
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The invention discloses a test interface card, which is applied between a mainboard to be tested and a signal conversion interface card, wherein the mainboard to be tested is provided with a first-specification interface controller, a second-specification interface controller and a storage module. The test interface card comprises a first-specification bus, a second-specification bus and a third-specification bus, wherein the first-specification bus is coupled between the first-specification interface controller and the signal conversion interface card, and transmits a first test signal transmitted by the first-specification interface controller to the signal conversion interface card; the second-specification bus is coupled between the signal conversion interface card and the storage module, and transmits an output signal of the signal conversion interface card back to the storage module; and the third-specification bus couples the second-specification interface controller to form a loopback. Therefore, a test is performed for all the buses to shorten the test time.
Description
technical field [0001] The invention relates to a test interface card, in particular to a test interface card applied to a blade server. Background technique [0002] Blade server (blade server) 900 refers to that the hardware of the server system such as processor, memory, even hard disk drive is integrated on the single blade-shaped motherboard, that is to say, multiple servers can work in one server case at the same time, share Among them, the power supply, display, etc., in order to achieve effective system integration. [0003] However, the relative blade server 900 will have a variety of bus specifications, such as: Peripheral Component Interconnect Express (PCI-E for short), Serial Attached SCSI (Serial Attached SCSI for short). SAS), Serial Advanced Technology Attachment (Serial Advanced Technology Attachment, referred to as SATA), etc., also increase the complexity of the blade server 900 in testing. [0004] refer to figure 1 , when the blade server 900 is teste...
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IPC IPC(8): G06F11/267
Inventor 蔡侨伦庄国峰
Owner WISTRON CORP