Method for determining highly accelerated stress screening test condition

Abstract

The invention provides a method for determining a highly accelerated stress screening test condition. The method comprises the following steps of: firstly, setting an initial testing condition according to the temperature and vibration comprehensive stress operation and damage limit of a product to carry out temperature and vibration comprehensive stress test; accurately obtaining the highly accelerated stress screening test condition by using a successive approximation method; and then verifying by using a typical defect of the product to obtain the validity of the screening test condition; and finally, obtaining the effective highly accelerated stress screening test condition of the temperature and vibration comprehensive stress through repeated tests and scientific adjustment. By using the test condition obtained by using the method provided by the invention, the screening test time can be largely reduced, the testing efficiency can be increased and the test cost can be saved.

Description

Technical field [0001] The invention relates to a testing method of a hardware circuit board, in particular to a method for determining high-accelerated stress screening test conditions. Background technique [0002] With the widespread application of electronic products, people's requirements for the quality of electronic products are also increasing, and the life of electronic products has become an important criterion for product quality. However, in the product manufacturing process, due to material defects, out-of-control process, equipment instability and other related objective factors, it is inevitable that some electronic products have potential non-design defects when they leave the factory. Later potential defects will gradually be exposed and lead to rapid product failure, greatly shortening the product life. [0003] The distribution of failures after the product arrives on the market can be represented by the "bathtub curve" commonly used in industrial production. A...

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Problems solved by technology

[0005] First, the period required for product screening tests is long, generally 2-3 days;

[0006] Second, the work efficiency is low, which greatly restricts the production capacity of the manufacturer;

[0007] Third, it takes up a lot of equipment and high labor costs, resulting in excessively high production costs and reducing product competitiveness

[0008] With the rapid expansion of society's demand for electronic products, the production capacity of electronic companies is also expanding day by day. The shortcomings of long environmental screening test cycle, low efficiency and high cost seriously delay the time for electronic products to be introduced to the market, which restricts the development of electronic manufacturing companies.

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