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System for measuring stereo object

An object and three-dimensional technology, applied in the field of measurement systems, can solve problems such as the inability of the machine to overcome the movement limit, and achieve the effects of avoiding dynamic acceleration and deceleration changes, reducing invalid areas, and high detection speed

Inactive Publication Date: 2013-10-02
TEST RES INC
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Problems solved by technology

In this way, it will make the machine unable to overcome the limit of motion

Method used

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  • System for measuring stereo object
  • System for measuring stereo object
  • System for measuring stereo object

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Embodiment Construction

[0052] In order to allow the examiner to better understand the technical content of the present invention, preferred specific embodiments are given as follows.

[0053] Please also refer to image 3 and Figure 4 , which respectively show a schematic appearance diagram and a block diagram of the "system for measuring three-dimensional objects" of the present invention. The system 1 for measuring a three-dimensional object of the present invention is used for measuring a three-dimensional object 90 (such as a circuit board with printed solder paste). The system 1 for measuring three-dimensional objects includes a base 20, a plane scanning device 30, a first light source emitting device 40, a second light source emitting device 50, an image capture device 70 and a control device 60 (will be described below Figure 4 details).

[0054] The planar scanning device 30 is arranged on the base 20, and the planar scanning device 30 can carry out planar movement relative to the base ...

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Abstract

The invention relates to a system for measuring a stereo object, comprising a base, a plane scanning device arranged on the base, a first light source emitting device, a second light source emitting device, an image capture device and a control device. The first light source emitting device, the second light source emitting device and the image capture device are connected to the plane scanning device, the control device is used for controlling the plane scanning device to do a planar motion, the first light source emitting device and the second light source emitting device respectively project light sources to the object alternatively and controlling the image capture device to capture images of the object; the first light source emitting device comprises a first light emitting element and a first lens, and the first light emitting element projects the first light source to the object; the second light source emitting device comprises a second light emitting element and a second lens, and the second light emitting element projects the second light source to the object; when the first or second light source is projected to the object and used for capturing a plurality of images of the object, the image capture device is located between the first light source emitting device and the second light source emitting device and comprises an induction chip module and a telecentric lens. According to the system for measuring the stereo object, dynamic acceleration and deceleration changes can be avoided.

Description

technical field [0001] The invention relates to a measuring system, especially a system for measuring three-dimensional objects. Background technique [0002] The measurement of a three-dimensional object usually requires an optical system including a "projection device" and an "imaging device". In short, the projection device projects structured light on a three-dimensional object to generate structured light and shadow, and the imaging device takes a picture of the three-dimensional object and simultaneously shoots the structured light and shadow of the three-dimensional object, thereby calculating the height of the three-dimensional object and using it 3D image display. [0003] It is becoming more and more common to apply 3D measurement technology to circuit board manufacturing inspection to improve production efficiency. In order to obtain 3D information, a current method is to project a periodic fringe pattern on the object to be measured. The periodic fringe phase ...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01B11/25G01B11/30
Inventor 温光溥林栋余良彬
Owner TEST RES INC
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