High-resolution high-speed polarization difference imaging method

Abstract

The invention relates to a high-resolution high-speed polarization difference imaging method. In the method, linearly polarized light which can be controlled and of which the polarization directions are orthogonally changed at a high speed is generated by using characteristics of a high-speed time division deviated light path of an acousto-optic deflector and a characteristic that a lateral displacement polarization prism spectrometer integrates orthogonal line polarized light, system resolutions in the two directions are improved, and the high-speed polarization difference imaging method is formed. By the method, the defect that only the system resolution in one direction can be improved in the prior art is overcome; the scanning efficiency of a system is improved; system errors are reduced; resolving accuracy is improved; and the system has higher stability and high high-resolution imaging speed.

Description

technical field [0001] The invention relates to an optical technology, in particular to a high-resolution and high-speed polarization difference imaging method. Background technique [0002] Polarization difference imaging has important research significance in the field of optical microscopy imaging. For example, the confocal microscope system is a point-to-point imaging of the object-image conjugate. The focused laser beam scans the surface of the sample, while the photoelectric detection device receives the reflected light (or transmitted light) of the sample. The change of the sample structure makes the intensity of the reflected light (or transmitted light) Change, so that the output current of the photodetector changes, after signal processing, it is displayed on the computer screen synchronously. Since the irradiated linearly polarized light is focused by a lens with a high numerical aperture, an elliptical spot with a small area is produced, so there is no influence...

AI Technical Summary

Problems solved by technology

In prior art, see "K.A.Serrels, E.Ramsay, R.J.Warburton and D.T.Reid, Nanoscale optical microscopy in the vectorial focusing regime, nature photonics, vol.2, May2008, 311-314", in order to improve the resolution, in scanning In the long axis direction, a half-wave plate is mechanically inserted to change the polarization direction of the incident ray polarized light, but this will reduce the scanning rate and system resolution accuracy when the system changes the scanning direction, and because one of the incident light passes through the One-half wave plate, so the incident power of the two beams of orthogonally polarized light is different, so that the power of the focused beam changes, which will increase the system error and the system stability is not high

Images