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Laser wavelength real-time measurement device

A technology for measuring devices and laser wavelengths, applied in measuring devices, optical radiation measurement, and measuring optics, etc., can solve problems such as inability to obtain laser wavelength phase and wavelength values ​​in real time, low signal-to-noise ratio of interference signals, and low measurement accuracy

Inactive Publication Date: 2011-11-23
NAT INST OF METROLOGY CHINA
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Problems solved by technology

In the optical path structure of the traditional Michelson-type wavelength meter, the effective utilization rate of the beam is low, and the signal-to-noise ratio of the interference signal is low. The wavelength value is measured by changing the number of fringes of the interference fringe, and the measurement accuracy is relatively low, and There is a problem that the phase and wavelength values ​​of the laser wavelength cannot be obtained in real time

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  • Laser wavelength real-time measurement device
  • Laser wavelength real-time measurement device
  • Laser wavelength real-time measurement device

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Embodiment Construction

[0029] For the convenience of description, the present invention will be further explained in conjunction with the drawings and specific embodiments. For elements of the same structure, serial numbers such as "first", "second", and "third" are used to distinguish them for ease of distinction, which are not intended to limit the specific structure.

[0030] In the wavelength measuring device of the present invention, all optical components are arranged on an optical platform to maintain the stability and repeatability of the optical system. As an embodiment of the present invention, such as figure 2 As shown, the optical path structure of the measurement device is roughly a combination of the advancing optical path of the reference light and the advancing optical path of the light to be measured, that is, the reference laser light path and the laser light path to be measured, preferably with polarization adjustment in the reference laser and the laser to be measured component...

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Abstract

The invention provides a laser wavelength real-time measurement device. The real-time measurement device comprises a reference laser, a laser to be measured, a first polarization splitting prism, a non-polarizing splitting prism, a multi-path photoelectric detection element and an electrical testing system, wherein the reference laser emits a reference laser with a specific wavelength; the laser to be measured emits a laser to be measured; the first polarization splitting prism performs polarization splitting to the reference laser and the laser to be measured, the split light beam is reflected back to the first polarization splitting prism by a cube-corner prism; the non-polarizing splitting prism is used to divide the reference laser or laser to be measured, which is emitted from the first polarization splitting prism, to two light beams in the same state; the two light beams pass through a polarization splitting prism for polarization splitting; the multi-path photoelectric detection element detects the light beam split by the polarization splitting prism; and the electrical testing system is used to determine the phase of the laser to be measured and the transient laser wavelength value according to the measurement signal of the multi-path photoelectric detection element. The high-precision real-time wavemeter is unique and novel in the principle of measurement, the systemhardware composition is changed and improved, the utilization efficiency of the laser power can be increased and the anti-interference capability of the wavemeter is improved.

Description

technical field [0001] The present invention relates to a wavelength measurement device, more specifically, to a measurement device for real-time detection and verification of the wavelength of a laser to be measured by utilizing the Michelson interference principle. Background technique [0002] As the reference value of measurement, laser wavelength is widely used in the measurement of various physical quantities such as length, angle, speed, flatness, straightness and verticality. Accurate measurement of wavelength size and stability is the key to ensure measurement accuracy and value traceability. [0003] For lasers with variable wavelengths, such as tunable semiconductor lasers, their output wavelength cannot be determined in advance when they are used. Specifically, tunable lasers can use their tuning structures to adjust their output light in a wide range of wavelengths. wavelength, while semiconductor lasers change their operating parameters, the wavelength of the ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01J9/02
Inventor 孙建平张学一陈允昌张金涛
Owner NAT INST OF METROLOGY CHINA