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E1 interface impedance testing device and system

An impedance test and interface technology, applied in the field of E1 interface test, can solve the problems of high cost and low efficiency, achieve the effect of low cost, improve detection efficiency, and not easy to make mistakes in human judgment

Inactive Publication Date: 2011-11-23
MAIPU COMM TECH CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0005] The purpose of the present invention is to overcome the shortcomings of high cost and low efficiency in the current E1 interface impedance testing system, and provide an E1 interface impedance testing device and system

Method used

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  • E1 interface impedance testing device and system
  • E1 interface impedance testing device and system
  • E1 interface impedance testing device and system

Examples

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Embodiment

[0031] The structural diagram of the E1 interface impedance testing system of this embodiment is shown in figure 2 , the structural schematic diagram of the E1 interface impedance testing device in this example is shown in image 3 , the structural diagram of the reference voltage source unit in this example can be found in Figure 4. The E1 interface impedance testing device of this embodiment is connected with the peak detection unit by the input terminal, the peak detection unit is connected with the window comparator unit, the window comparator unit is connected with the logic circuit unit, the logic circuit unit is connected with the display unit, and the reference voltage source unit is connected with the display unit. The window comparator unit is connected, wherein the peak detection unit is used to perform peak detection on the signal input at the input terminal and transmit it to the window comparator unit, and the window comparator unit is used to compare the rece...

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Abstract

The invention relates to the E1 interface testing technology of data communication equipment, solves the problems of relatively high cost and low efficiency of the existing E1 interface impedance testing system, and provides an E1 interface impedance testing device and system. The technical scheme comprises an E1 interface impedance testing device, and is characterized by comprising an input end, a peak detection unit, a window comparator unit, a logic circuit unit and a display unit, wherein the input end is connected with the peak detection unit; the peak detection unit is connected with the window comparator unit; the window comparator unit is connected with the logic circuit unit; and the logic circuit unit is connected with the display unit. The device provided by the invention improves the E1 interface impedance testing efficiency, reduces the cost and is applicable to an E1 interface impedance testing system.

Description

technical field [0001] The invention relates to the E1 interface testing technology of data communication equipment, in particular to an E1 interface impedance testing device and method. Background technique [0002] E1 is a 30-channel pulse code modulation PCM in Europe, the rate is 2.048Mbit / S; E1 interface is a common interface form of data communication equipment, especially the most common on routers, usually a data communication equipment can provide 8 to 32 E1 port. These data communication devices need to be tested when they are manufactured and leave the factory. Interface impedance is one of the important testing items. [0003] The structure diagram of the current E1 interface impedance test system is as follows: figure 1 As shown, if you want to test whether the switching of 75 and 120 ohms is successful, it is usually judged whether the switching is successful by the voltage value of the electrical characteristics of the interface. According to the standard r...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R27/14
Inventor 胡松
Owner MAIPU COMM TECH CO LTD
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