A method for detecting beam polarization spectral characteristics

A polarization spectrum and detection method technology, applied in the field of optics, can solve problems such as the inability to detect optical properties and system performance parameters, the inability to detect the distribution of the transverse polarization state of the beam, and the inability to detect the information on the polarization characteristics of the beam, and achieve low and high structural positioning requirements. High-precision spectral measurement and beam transverse polarization state distribution analysis, the effect of simple and flexible implementation method

Inactive Publication Date: 2011-11-30
HANGZHOU DIANZI UNIV
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Problems solved by technology

[0003] In the prior art, there is a method for detecting the optical polarization spectral characteristics. The polarization characteristics of the search beam usually use an analyzer. When the detected beam passes through the analyzer, only the light energy with the same polarization direction as the polarization passing direction of the analyzer Through, although this method has certain advantages, it has essential deficiencies. This method is essentially unable to detect the distribution of the transverse polarization state of the beam, so it cannot detect the interaction between light and matter related to the characteristics of the polarization distribution, spectral analysis, optical measurement, Optical properties and system performance parameters in areas such as optical instrument evaluation
In the prior art, spectrometers are used to measure the spectral characteristics of light beams, see the invention patent integrated miniature spectrometer, the patent number is ZL02119512.9, this invention has certain advantages, but there are still essential deficiencies, the system is complex, and the structure positioning requirements are high; the system spectrum The analysis accuracy is limited by the parameters of the grating and the photoelectric sensor, and it is impossible to achieve high-sensitivity spectral measurement; and it is essentially impossible to detect the polarization characteristic information of the beam

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  • A method for detecting beam polarization spectral characteristics
  • A method for detecting beam polarization spectral characteristics
  • A method for detecting beam polarization spectral characteristics

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[0021] The present invention will be further described below in conjunction with drawings and embodiments.

[0022] In the prior art, an analyzer is usually used to detect the polarization characteristics of the beam. This method is essentially unable to detect the distribution of the transverse polarization state of the beam. The spectrometer used to measure the spectral characteristics of the beam has a complex system and high requirements for structural positioning. Due to the limitations of photoelectric sensor parameters, it is impossible to achieve high-sensitivity spectral measurement, and it is essentially impossible to detect the polarization characteristic information of the beam. The purpose of the present invention is to address the deficiencies of the above technologies, and provide a method for detecting the polarization spectrum characteristics of light beams, which has the functions of simple implementation, low structural positioning requirements, analysis of t...

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Abstract

The invention relates to a method for detecting the polarization spectrum characteristic of light beams. The prior art system is complicated and the sensitivity of spectral measurement is low, and it is impossible to realize the detection of the polarization state distribution of the light beam and the simultaneous detection of polarization and spectral characteristics. The invention utilizes a flexible polarizing film to make a conical light beam polarization detection element, and a flat electro-optic crystal coated with a high-reflection film on both sides is provided with parallel light-transmitting electrode plates, which are connected to an adjustable power supply. Constitute a microcavity line scanning element; the incident beam passes through the conical beam polarization state detection element, the microcavity line scanning element, the beam converging element and the area array photodetector in turn, and the area array photodetector collects spectral information and The light spot of the polarization distribution is obtained, and then the polarization spectral characteristics of the beam are obtained. The method of the invention is simple and flexible, has low structural positioning requirements, simultaneously realizes high-precision spectrum measurement and beam transverse polarization state distribution analysis, has high system reliability and stability, and has strong operability.

Description

technical field [0001] The invention belongs to the field of optical technology, and relates to an optical characteristic detection method, in particular to a light beam polarization spectrum characteristic detection method. It is mainly used for the detection of beam characteristics in the fields of light-matter interaction, spectral analysis, optical measurement, and optical instrument evaluation. Background technique [0002] The demand for detection of optical properties of light beams widely exists in the fields of light-matter interaction, optical microscopy, spectral analysis, optical measurement, and optical instrument evaluation. In the field of interaction between light and matter, after the light beam is scattered by the material, the polarization state and spectral characteristics of the scattered light in different directions are different. By detecting the polarization state distribution and spectral characteristics of the scattered light, the nature of the mat...

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01J3/447G01J4/00
Inventor 高秀敏胡松辛青
Owner HANGZHOU DIANZI UNIV
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