Testing method for wide spectrum photoelectricity testing system
A technology of optoelectronic testing and testing methods, applied in the field of optical radiation calibration measurement, can solve the problems of single testing function, limited testing object and testing spectral range, etc., and achieve the effect of wide-spectrum beam splitting measurement
Inactive Publication Date: 2013-05-22
HUAZHONG UNIV OF SCI & TECH
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[0004] The present invention proposes a test method using a wide-spectrum photoelectric test system to solve the problems of single test function, limited test object and test spectrum range of the existing photoelectric detector test system
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[0044] Such as figure 1 As shown, the wide-spectrum photoelectric test system utilized in the present invention includes a wide-spectrum light source 1, a monochromator 2, a filter wheel 3, a dark box 10, a data acquisition and amplification circuit 11, a motor drive circuit 12, a bias circuit 16 and a computer 13. A collimating optical system 4, a spectroscope 5, a first motorized turntable 14 and a second motorized turntable 15 are installed in the dark box 10, and the first standard photodetector 6 and the second standard photodetector are installed on the first motorized turntable 14. 7, a first reference photodetector 8 and a second reference photodetector 9 are installed on the second motorized turntable 15, and the light emitted by the wide-spectrum light source 1 enters the monochromator 2 for spectroscopic separation, and is filtered out by the filter wheel 3 High-order spectrum, output monochromatic light, then collimated into parallel light by the collimating optica...
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The invention discloses a testing method by using a wide spectrum photoelectricity testing system, which belongs to an optical radiation calibration measuring instrument and solves the problems of single testing functions and limited testing objects and testing spectrum ranges in the conventional testing system. The wide spectrum photoelectricity testing system comprises a wide spectrum light source, a monochromator, an optical filter wheel, a dark box, a data acquisition amplifying circuit, a biasing circuit, a motor diving circuit and a computer, a data sampling module and a testing function module. In the system, by using a spectral a response testing submodule and an ampere characteristic testing submodule of the testing function module, measurement parameters such as spectral responses, ampere characteristics and the like of a photoelectric detector are combined together, so that the range of a wide spectrum can be measured; and the measurement accuracy is effectively improved, and the range of testing devices is expanded, so that the performance of a zero offset photodiode, and a PIN pipe, an avalanche photodiode(APD) and a phototriode which need a certain bias voltage can be tested.
Description
technical field [0001] The invention belongs to an optical radiation calibration measurement method, in particular to a test method using a wide-spectrum photoelectric test system, which can realize the measurement of spectral responsivity from ultraviolet spectrum to infrared spectrum and the measurement of volt-ampere characteristics with a bias voltage of 0-15V . Background technique [0002] Spectral response and volt-ampere characteristics are the main performance parameters of photodetectors. Testing these parameters is of great significance to the actual design of photoelectric systems and the improvement and improvement of photodetector device manufacturing processes. [0003] Existing photodetector test systems on the market, such as photodetector testers from companies such as Newport, include wide-spectrum light sources, monochromators, filter wheels, dark boxes, data acquisition and amplification circuits, motor drive circuits and computers, computers Loaded wit...
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IPC IPC(8): G01R31/26G01J3/42
Inventor 赵茗刘瑜元秀华
Owner HUAZHONG UNIV OF SCI & TECH