Switching circuit and switch testing system using same
A switch circuit and switch technology, applied in the field of switch test system, can solve the problems of small leakage current, large leakage current, inaccurate impedance test, etc., achieve control logic and high cost, and achieve reliable results
Inactive Publication Date: 2013-04-17
赖德龙
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[0007] The present invention proposes a switch circuit and a switch test system composed of a switch circuit. By introducing a grounding structure, it has a high impedance at the cut-off time and makes the leakage current small. inaccurate technical issues
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[0026] In a switching system with multiple parallel switching components, the insulation resistance or leakage current of the solid-state switch in each switching component at OFF (OFF) determines the high resistance measurement capability of the entire switching circuit.
[0027] Figure 3A Shown is the basic circuit schematic of a switch, a power supply at voltage V with a solid state switch SW and resistor R L Form a loop. Figure 3B Shown is the equivalent circuit of the switch open circuit insulation resistance, where the leakage current I of the solid-state switch SW leak_A =V / (R off +R L ), R off is the insulation resistance when the solid-state switch SW is off.
[0028] Among them, R L =0, the maximum leakage current is:
[0029] I leak_A ==V / R off (1)
[0030]further, Figure 4A Shown is the basic circuit diagram of the improved switch, the Figure 3A The middle solid-state switch SW evolves into three solid-state switches SW with the same structure a...
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The invention discloses a switching circuit and a switch testing system using the same. The switching circuit comprises a first switch and a second switch which are provided between and are in series connection with a testing voltage source and a test point, wherein, control terminals of the first switch and the second switch are respectively connected with a first control signal, and a third switch which is provided between a common port of the first switch and the second switch and ground and is in series connection with the common port and ground, wherein, a control terminal of the third switch is connected with a second control signal; the firstsecond switch and the third switch are made to operate contrarily by the first control signal and the second control signal, and when the first switch and the second switch are closed, the third switch is conducted for ground connection. According to the invention, a grounding structure is introduced into the switching circuit, which enables the ratio of insulation resistance to conduction resistance when the switching circuit is closed to be very great, thereby reducing leakage current when a switch assembly is closed. According to theinvention, reliable testing is realized; parallel connection of switch circuits with more grades can be realized; insulation target measuring of 100 M omega is reached.
Description
technical field [0001] The present invention relates to a switch circuit, in particular to a switch circuit which introduces a grounding structure and has high impedance at cut-off time so that the leakage current is small, and a switch test system realized by using the switch circuit. Background technique [0002] Switching circuits are widely used among various test tools in circuit board manufacturing. The performance of testing high resistance (insulation resistance) is limited by the number of test points due to the open circuit leakage current of switching components. In current designs, mechanical contact relays (Relay) or solid-state components are used as switching circuits. The relay uses general atmosphere, filled inert gas, or vacuum as the electrical medium for breaking the circuit. Solid-state circuits use semiconductor junctions or channels as the electrical medium for breaking circuits. [0003] Although the relay has excellent breaking characteristics, it...
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IPC IPC(8): H03K17/78G01R31/28
Inventor 赖德龙
Owner 赖德龙