Light detection machine foreign matter detection device and method
A foreign object detection and light inspection technology, applied in the direction of optical testing flaws/defects, can solve the problems of shortened service life, large noise, large moment of inertia, etc., to reduce the radius of gyration and moment of inertia, reduce the degree of damage, extend the The effect of service life
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
Method used
Image
Examples
Embodiment Construction
[0020] figure 1 It shows an embodiment of a foreign object detection device for a lamp inspection machine of the present invention, the foreign object detection device includes a lamp inspection tray 1 for placing bottles and a plurality of detection stations arranged along the periphery of the lamp inspection tray 1, and each inspection station The bottle body near the light inspection plate 1 is provided with more than two groups of light inspection cameras, and each light inspection camera group corresponds to a set of bottle bodies distributed at intervals, and each light inspection camera group is provided with more than two light inspection cameras 3, All the bottles passing through the inspection station are detected by a plurality of lamp inspection camera groups, which makes it unnecessary for two adjacent lamp inspection cameras 3 to carry out tracking and photographing detection on two consecutively arranged bottles. The circumferential direction of the disc 1 provi...
PUM
![No PUM](https://static-eureka.patsnap.com/ssr/23.2.0/_nuxt/noPUMSmall.5c5f49c7.png)
Abstract
Description
Claims
Application Information
![application no application](https://static-eureka.patsnap.com/ssr/23.2.0/_nuxt/application.06fe782c.png)
- R&D Engineer
- R&D Manager
- IP Professional
- Industry Leading Data Capabilities
- Powerful AI technology
- Patent DNA Extraction
Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.
© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com