Radiation detection device and manufacturing method
A manufacturing method and detection device technology, applied in radiation control devices, radiation intensity measurement, electrical components, etc., can solve problems such as insufficient bonding force, semiconductor damage, poor thickness control, etc.
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
Method used
Image
Examples
Embodiment Construction
[0083] exist figure 1 In, a semiconductor crystal volume is shown forming a parallelepiped-shaped semiconductor block 100 with a square cross-section, which is shown in plan view so that the figure shows the square shape of the semiconductor block 100 upper surface. The semiconductor material here is cadmium zinc telluride. Other semiconductor materials can also be used. The side length of the square is several centimeters, here 2.5 cm. Strips 110 of metal are deposited on the upper surface of said semiconductor block 100 , directly on the semiconductor material, the metal used here being gold or, according to a variant, platinum. Other conductive metals can also be used.
[0084] exist figure 1 In , twelve metal strips 110 are seen extending parallel to each other along a direction 105 parallel to one side of the square, called the first direction for the sake of presentation. Said strips 110 are formed at the surface of said semiconductor block 100 directly on its up...
PUM
Login to View More Abstract
Description
Claims
Application Information
Login to View More - R&D
- Intellectual Property
- Life Sciences
- Materials
- Tech Scout
- Unparalleled Data Quality
- Higher Quality Content
- 60% Fewer Hallucinations
Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.
© 2025 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com
