Testing system and method for mixed-mode IC (integrated circuit)

Abstract

The invention provides a testing system and a method for a mixed-mode IC (integrated circuit). The testing system comprises an analog-to-digital converter, a phase-locked loop, a timing pin, a first-in first-out buffer and an automatic testing device, wherein the analog-to-digital converter receives a testing signal and converts the testing signal into digital input data, the phase-locked loop receives a first external timing signal to generate an input timing signal, the timing pin is used for receiving a second external timing signal, the first-in first-out buffer is used for writing in the digital input data according to the input timing signal and for reading out data of the first-in first-out buffer according to the second external timing signal, the automatic testing device is used for generating the testing signal, the first external timing signal and the second external timing signal and locking the data of the first-in first-out buffer according to the second external timing signal.

Description

technical field [0001] The invention relates to the technical field of integrated circuit testing, in particular to a testing system and method for mixed-mode integrated circuits. Background technique [0002] With the advancement of integrated circuit technology, the application design of integrated circuits is becoming more and more complex, so integrated circuit testing has become an important part of the integrated circuit manufacturing process. Integrated circuit testing mainly uses automatic testing equipment (Automatic Testing Equipment, ATE), using test programs to simulate various possible use environments and methods of integrated circuits, such as in harsh environments such as high temperature, low temperature, voltage instability, and high or low voltage Under normal use conditions, the integrated circuit under test is placed in this simulated environment to test whether its working state is within the specification range, so as to ensure the quality of the integ...

AI Technical Summary

Problems solved by technology

However, because the internal memory of the logic analyzer (LA) 160 is limited and its memory size is not easy to increase, it is difficult for the logic analyzer (LA) 160 to collect a large amount of data for analysis, and it is also limited by the logic analyzer (LA) 160 price, the cost of testing will increase a lot

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