Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Simplified element measurement method through laser-induced plasma spectral standardization

A plasma spectroscopy, laser-induced technology, applied in the field of element measurement, can solve the problems of low precision, low measurement accuracy, low repeatability and so on

Active Publication Date: 2012-04-11
TSINGHUA UNIV
View PDF2 Cites 11 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] The purpose of the present invention is to provide an element measurement method based on simplified spectral standardization, which can be used in laser-induced plasma spectroscopy systems, in view of the shortcomings of the current laser-induced plasma spectroscopy technology, such as low repeatability and low precision when directly measuring material components. , to solve the problems of low repeatability and low measurement accuracy of the technology

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Simplified element measurement method through laser-induced plasma spectral standardization
  • Simplified element measurement method through laser-induced plasma spectral standardization
  • Simplified element measurement method through laser-induced plasma spectral standardization

Examples

Experimental program
Comparison scheme
Effect test

Embodiment

[0051] 1) Take 20 brass alloys whose concentration of each element is known, as a group of calibration samples, numbered 1 to 20 respectively, the concentration of element copper in this group of samples is 73%, 60.28%, 59.14%, 56.62%, respectively, 59.55%, 69.08%, 80.9%, 85.06%, 90.02%, 95.9%, 96.86%, 94.46%, 92.7%, 89.97%, 70.44%, 67.59%, 64.32%, 63.42%, 60.81%, 57.98%;

[0052] 2) For each sample of 20 brass alloys, use a laser-induced plasma measurement system to detect different positions on the sample surface in a protective gas atmosphere, and obtain the atomic characteristic lines and ions of each element in the calibration sample Characteristic lines;

[0053] 3) For all measurements of the 20 brass alloys, select the atomic and ion characteristic lines of the analyte Cu that conform to the Lorentzian line type: Cu(I)216.51, 261.837, 282.437, 296.116, 427.511, 522.007, 570.024, 578.213,793.312,809.263nm;Cu(II)201.69,202.549,204.38,206.242,208.792,210.039,216.991,221....

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention relates to a simplified element measurement method through laser-induced plasma spectral standardization, which can be used for element concentration detection according to the laser-induced plasma spectral principle. In the method, the strength of a plurality of characteristic spectral lines of elements to be measured and the total particle number of the characteristic elements to be measured are utilized, the logarithm of the strength ratio of the characteristic spectral lines is utilized for characterizing the temperature, the full width at half maximum of the spectral lines is utilized for characterizing the electron density, the fluctuation of the temperature and the electron density is further utilized for characterizing the fluctuation of physical parameters of plasma, and a calibration model for reflecting the relation among the element concentration, the strength of the characteristic spectral lines, the particle number of the characteristic elements, and the fluctuation quantity of the temperature and the electron density. When the measurement is performed on a sample with unknown components, the concentration of the elements to be measured can be obtained according to the calibration model. As the calibration model takes the ablation quality and the impacts of the temperature and the electron density of the plasma on measurement signals into consideration, the fluctuation of the spectral strength caused by the fluctuation of the physical parameters of the plasma is compensated and the measurement precision is greatly improved.

Description

technical field [0001] The invention relates to an element measuring method. Specifically, the basic principle of the method is laser-induced plasma spectroscopy (LIBS), and a simplified spectral normalization method is used for online rapid quantitative analysis of the measured samples. Background technique [0002] In recent years, laser-induced plasma spectroscopy (LIBS for short) has become a new elemental analysis technique due to its advantages of high sensitivity, no need for sample pretreatment, and realization of multi-element measurement. However, due to the low repeatability of this technique, the accuracy of measuring the elemental composition of substances is not high, which limits the application of this technique in element measurement. Contents of the invention [0003] The purpose of the present invention is to provide an element measurement method based on simplified spectral standardization, which can be used in laser-induced plasma spectroscopy systems...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): G01N21/63
Inventor 王哲李政李立志侯宗余袁廷璧
Owner TSINGHUA UNIV
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com