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Formation method of shallow trench isolation structure

An isolation structure and shallow trench technology, applied in electrical components, semiconductor/solid-state device manufacturing, circuits, etc., can solve problems such as short circuits and punch-throughs, avoid losses, reduce wet etching time, and increase wet etching rate. Effect

Active Publication Date: 2012-04-11
SEMICON MFG INT (SHANGHAI) CORP +1
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  • Summary
  • Abstract
  • Description
  • Claims
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Problems solved by technology

However, punch-through or short circuits usually occur between the polysilicon gate structures formed on the surface of the substrate 100

Method used

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  • Formation method of shallow trench isolation structure
  • Formation method of shallow trench isolation structure
  • Formation method of shallow trench isolation structure

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Embodiment Construction

[0012] It can be seen from the background art that punch-through or short circuit usually occurs between the polysilicon gate structures formed on the surface of the substrate 100 . For this reason, the inventors of the present invention have found through research that the punch-through or short-circuit phenomenon is due to the fact that the shallow trench isolation structure 101 located between the polysilicon gate structures and higher than the surface of the substrate 100 is too narrow to effectively electrically isolate Adjacent polysilicon gate structures, so that the adjacent polysilicon gate structures have a punch-through or short circuit phenomenon.

[0013] After further research by the inventors, it was found that the reason why the shallow trench isolation structure above the substrate surface was too narrow was that the hard mask layer and the pad oxide layer were removed by a wet method, while the pad oxide layer and the shallow trench The material used for the ...

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Abstract

The invention relates to a formation method of a shallow trench isolation structure. The method is characterized in that: a substrate is provided, wherein a substrate oxide layer is formed on the surface of the substrate; doped ion implantation is carried out on the substrate oxide layer to form a doped substrate oxide layer; a hard mask layer is formed on the surface of the doped substrate oxide layer; grooves are formed in the hard mask layer, the doped substrate oxide layer and the substrate; filling dielectric layers are formed for filling the grooves; the hard mask layer is removed and the doped substrate oxide layer is exposed; and the doped substrate oxide layer is removed to expose the substrate. According to the invention, on occurrence of a punchthrough phenomenon or a short circuit phenomenon of adjacent polysilicon gate structures that are formed at two sides of the shallow trench isolation structure can be avoided.

Description

technical field [0001] The invention relates to the field of semiconductor manufacturing, in particular to a method for forming a shallow trench isolation structure. Background technique [0002] As semiconductor technology enters the deep sub-micron era, components below 0.18 microns, such as CMOS integrated circuits, mostly use shallow trench isolation structures for lateral isolation between active regions, and more can be found in US Patent No. US7112513 Information about Shallow Trench Isolation Technology. [0003] The shallow trench isolation structure is a device isolation technology, and its specific process includes: providing a substrate with a pad oxide layer and a hard mask layer sequentially formed; sequentially etching the hard mask layer, pad oxide layer, and liner Form a shallow trench at the bottom; fill the shallow trench with a medium, and form a dielectric layer on the substrate surface, the dielectric material can be silicon oxide; anneal the medium; u...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): H01L21/762H01L21/265
Inventor 杨芸洪中山
Owner SEMICON MFG INT (SHANGHAI) CORP
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