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Accelerated degradation testing method for nitrile rubber O-shaped sealing ring based on step stress

An accelerated degradation test, O-ring technology, applied in measurement devices, instruments, mechanical devices, etc., can solve the problems of complex sequential stress application methods and difficult process control, saving test costs, effectively analyzing, reducing effect of error

Inactive Publication Date: 2012-06-13
BEIHANG UNIV
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

The application method of sequential stress is more complicated, and the process is more difficult to control. Generally, it is rarely used. Compared with constant stress, the application method of step stress can save test time and cost to a large extent. Therefore, step stress is used for rubber sealing rings. It is also a successful exploration to study it with the accelerated degradation test method

Method used

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  • Accelerated degradation testing method for nitrile rubber O-shaped sealing ring based on step stress
  • Accelerated degradation testing method for nitrile rubber O-shaped sealing ring based on step stress
  • Accelerated degradation testing method for nitrile rubber O-shaped sealing ring based on step stress

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Experimental program
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Effect test

Embodiment

[0086] The step stress accelerated degradation test was carried out on the nitrile rubber O-ring used in a certain type of electro-hydraulic steering gear system. The pre-test sample size was 6, the formal test sample size was 12, and the 4 temperature stress levels were 70°C , 80°C, 90°C, 100°C, the test time is 79 days, the number of measurement points is 13 at 70°C, 16 at 80°C, 17 at 90°C, and 14 at 100°C. It was tested as described above.

[0087] Step 1, pre-test of nitrile rubber O-ring;

[0088] Select 90°C as the accelerated stress, put six rubber rings into the constant temperature accelerated test, and measure the thickness change of the rubber once a day. The obtained degradation data of 6 samples are as figure 2 shown.

[0089] Step 2, determining the stress value of the degradation fitting model and the formal test;

[0090] Use different data models to fit the results of the pre-test, and select the one with the best fitting effect. Specific as Figure 3 ~...

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Abstract

The invention discloses an accelerated degradation testing method for a nitrile rubber O-shaped sealing ring based on step stress, which includes the concrete steps: firstly, preliminarily testing the nitrile rubber O-shaped sealing ring; secondly, determining an accelerated simulation model and the stress level of a formal test; thirdly, testing step-stress accelerated degradation of the nitrilerubber O-shaped sealing ring; fourthly, arranging degradation data; and fifthly, building an accelerated degradation model for predicting the reliable life of the sealing ring. By means of applying the step stress, testing cost and testing time can be greatly reduced, and an example verification failure mechanism is unchanged. Evaluation of the degradation data is based on a plurality of degradation paths of a plurality of test specimens, errors caused by difference among the specimens can be greatly reduced, and the reliability of evaluation results is higher than that of aging life prediction.

Description

technical field [0001] The invention relates to an accelerated degradation test method of a nitrile rubber O-shaped sealing ring based on step stress, and belongs to the technical field of accelerated degradation tests. Background technique [0002] At present, research on accelerated degradation tests mainly focuses on the reliability evaluation of electronic products such as light-emitting diodes, lasers, logic integrated circuits, power supplies, insulators, and pharmaceuticals. The degradation research on rubber products is mainly based on accelerated aging tests. method, it is rare to use the method of accelerated degradation test to study it. The test method of accelerated aging stress application method is constant, the test time is long, and the model for evaluating its aging life is based on a single aging track under each constant stress, which does not consider the large error caused by the difference between samples , and the evaluation model is relatively simpl...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N19/00
Inventor 王晓红张新王立志戴城国许小靓李秋茜
Owner BEIHANG UNIV
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