Maintenance-free high-temperature gas sampling probe
A high-temperature gas, sampling probe technology, applied in sampling devices and other directions, can solve the problems of analysis distortion, inability to effectively remove the crust at the sampling port, gas port blockage, etc., to achieve the effect of improving accuracy, realizing maintenance-free use, and avoiding sampling interruption.
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[0023] Preferred embodiments of the present invention will be described in detail below. It should be understood that the preferred embodiments are only for illustrating the present invention, but not for limiting the protection scope of the present invention.
[0024] see figure 1 , a maintenance-free high-temperature gas sampling probe, consisting of a jacketed cooling shell tube 21, a bumper assembly 22, a sample gas sampling tube, and a bumper drive assembly 23;
[0025] see figure 2 The jacketed cooling shell pipe 21 includes a jacketed cooling pipe 2 including an inner cylinder 24 and a cooling layer 25 at least partially covering the outside of the inner cylinder 24. One end of the jacketed cooling pipe 2 is a pipe head 1, and the pipe is The middle part of the head 1 has a sampling port 21 connected to the inner cylinder 24, the other end of the jacketed cooling pipe 2 is provided with a collision head assembly connecting flange 5, and the cooling layer 25 is provid...
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