Digital slide real time scanning automatic focusing system and method thereof

Abstract

The invention discloses a digital slide real time scanning automatic focusing system and a method thereof. The focusing system comprises an optical microscopic device, an optical spectral device, a focusing controller, a displacement controller, a first auxiliary imaging device and a second auxiliary imaging device, wherein a main imaging device, the first auxiliary imaging device and the second auxiliary imaging device are adjusted by the focusing controller to provide the main imaging device, the first auxiliary imaging device and the second auxiliary imaging device a common field of view, the spectral device is used for dividing a light path from the common field of view into a main light path, a first auxiliary light path and a second auxiliary light path, the focusing controller performs comparative analysis according to focusing factors of a first image, a second image and a main image, the displacement controller estimates the position of a focal plane of next field of view according to the analysis results of the focus controller for three images in the present field of view, and simultaneously the displacement controller controls an object holding stage or an object lens to move to the next field of view. By means of the scheme, compatibility with traditional optical microscopic devices is good, repeated development is not required, fast acquisition of an optimum focal plane is achieved, and accuracy of the acquired focal plane is high.

Description

technical field [0001] The invention relates to a digital slice focusing system and method, in particular to a digital slice real-time scanning automatic focusing system and method. Background technique [0002] In the scanning of digital slices with a microscope, the focus of the field of view is a very critical indicator, and its focusing effect directly affects the clarity of image imaging, and thus directly affects the scanning quality of digital slices. [0003] The traditional automatic focusing of the microscope uses several images captured at different Z-axis positions (the direction in which the objective lens moves up and down) in a field of view, and each image comes from a different Z position, and then calculates the texture clarity of these several different Z-level images , also called the focusing factor. The conventional method of calculating the focus factor is to use image edge detection, the greater the edge change, the sharper the image, so the greater ...

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Problems solved by technology

But the disadvantage of this method is that the focal plane compensation of each field of view is based on the established focusing mathematical model. If the slice surface is complicated, or the hardware environment changes slightly due to various factors such as mechanical vibration during scanning, it will affect the The matching error between the mathematical model and the actual situation leads to an error in the estimated focal plane, which affects the focusing effect and the clarity of the captured image, and reduces the quality of the scanned digital slice

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