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Semiconductor package and manufacturing method thereof

A semiconductor, stack packaging technology, applied in semiconductor/solid-state device manufacturing, semiconductor devices, semiconductor/solid-state device components, etc., can solve problems such as semiconductor packaging reliability degradation

Active Publication Date: 2017-04-12
SAMSUNG ELECTRONICS CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Excessive heat generation due to high power consumption during semiconductor device operation can degrade reliability of semiconductor packages if not handled properly

Method used

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  • Semiconductor package and manufacturing method thereof
  • Semiconductor package and manufacturing method thereof
  • Semiconductor package and manufacturing method thereof

Examples

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Embodiment approach

[0019] Exemplary embodiments of the present inventive concept will be described in more detail below with reference to the accompanying drawings. However, the inventive concept may be embodied in different forms and should not be construed as limited to the embodiments set forth herein. Rather, these embodiments are provided so that this disclosure will be thorough and complete, and will fully convey the scope of the inventive concept to those skilled in the art.

[0020] The terms used in this specification are for describing the specific embodiments only, and are not intended to limit the inventive concept. Expressions used in the singular include plural expressions unless they have clearly different meanings in context. In this specification, it will be understood that terms such as "comprising" or "having" are intended to indicate the presence of features, numbers, steps, actions, components, parts or combinations thereof disclosed in this specification, and are not inten...

Embodiment approach 1

[0023] Figure 1A to Figure 1K is a cross-sectional view illustrating a method of manufacturing a semiconductor package according to an embodiment of the present inventive concept. Figure 1L is a perspective view of a heat dissipation layer in a method of manufacturing a semiconductor package according to another embodiment of the inventive concept.

[0024] refer to Figure 1A , the second semiconductor chip (chip) 200 may be stacked on the first semiconductor chip 100 . The carrier 90 may be provided to easily handle the first and second semiconductor chips 100 and 200 and reduce warpage and / or damage. As one example, the first semiconductor chip 100 may be mounted on the carrier 90 with the adhesive layer 95 interposed therebetween and the second semiconductor chip 200 may be stacked on the first semiconductor chip 100 . Carrier 90 may include silicon, metal, glass, and the like.

[0025] The first semiconductor chip 100 and the second semiconductor chip 200 may be the ...

no. 2 approach

[0060] Figure 2A to Figure 2F is a cross-sectional view illustrating a method of manufacturing a semiconductor package according to some embodiments of the inventive concept. Figure 2G with Figure 2H is a perspective view of a heat dissipation layer in a method of manufacturing a semiconductor package according to some embodiments of the inventive concepts.

[0061] refer to Figure 2A , the first semiconductor chip 100 may be mounted on the carrier 90 with the adhesive layer 95 interposed therebetween and the second semiconductor chip 200 may be stacked on the first semiconductor chip 100 . An underfill layer 250 surrounding the conductive bumps or solder balls 210 may be formed between the first semiconductor chip 100 and the second semiconductor chip 200 . The planarization molding layer 350 may be formed by forming and planarizing the resin layer 300 (shown in dashed lines). The top surface 200s of the second semiconductor chip 200 may be as Figure 1B The non-acti...

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PUM

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Abstract

The invention provides a semiconductor package and a manufacturing method thereof. In one embodiment, for the manufacture of semiconductor packages, a wafer is provided in which semiconductor chips are manufactured. A heat dissipation layer is formed over the entire wafer. The heat dissipation layer contacts the top surface of the semiconductor chip. Thereafter, a plurality of semiconductor chips are separated from the wafer.

Description

technical field [0001] The disclosure herein relates to semiconductors, and more particularly, to semiconductor packages and methods of manufacturing the same. Background technique [0002] Integrated circuit packaging technology continues to improve to meet demands for miniaturization and higher mounting reliability of semiconductor packages. In particular, improving the efficiency of the mounting process and improving the mechanical and electrical reliability after mounting have become important goals of the semiconductor industry. If not handled properly, excessive heat generation due to high power consumption during semiconductor device operation can degrade the reliability of semiconductor packages. Contents of the invention [0003] The present disclosure provides a semiconductor package with improved reliability and a method of manufacturing the same. [0004] In one embodiment, a method of manufacturing a semiconductor package includes: providing a wafer having a...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): H01L21/98H01L25/065H01L23/31H01L23/367
CPCH01L21/561H01L23/3128H01L24/97H01L2224/16225H01L2224/32225H01L2224/48091H01L2224/48227H01L2224/73204H01L2224/73215H01L2224/73253H01L2224/73265H01L2224/97H01L2924/01013H01L2924/01029H01L2924/01047H01L2924/01073H01L2924/01079H01L2924/15311H01L2924/1815H01L2924/18161H01L24/48H01L25/0657H01L25/18H01L25/50H01L2224/73257H01L2225/06517H01L2225/06589H01L2924/01005H01L2924/01006H01L2924/01019H01L2924/01024H01L2924/01033H01L2924/01068H01L2924/01074H01L2924/014H01L2225/06513H01L2225/06506H01L2225/06541H01L2225/06568H01L23/3677H01L24/16H01L24/32H01L21/6835H01L24/73H01L2224/16145H01L2224/32145H01L2224/48145H01L2221/68327H01L2221/6834H01L23/36H01L23/3672H01L2224/13025H01L2224/451H01L2924/181H01L2924/12042H01L2924/14H01L2924/00014H01L2224/81H01L2924/00H01L2924/00012H01L2224/45099H01L2224/45015H01L2924/207H01L23/4334H01L23/367H01L23/5226H01L24/17
Inventor 崔银景郑世泳崔光喆闵台洪李忠善金晶焕
Owner SAMSUNG ELECTRONICS CO LTD