Face identification method based on wavelet multi-scale analysis and local binary pattern
A local ternary mode and multi-scale analysis technology, applied in character and pattern recognition, computer components, instruments, etc., can solve problems such as being easily affected by factors such as illumination and location, increasing method complexity, and affecting method performance. Achieve the effect of enhancing the image texture feature extraction ability, improving the face recognition rate, and fast calculation speed
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
Method used
Image
Examples
Embodiment Construction
[0026] The technical solution of the present invention will be described below in combination with specific implementation modes. It should be noted that the embodiments only deepen the understanding of the technical solutions, but do not limit the invention in any way.
[0027] like figure 1 As shown, this embodiment includes the following steps:
[0028] 1) Image selection, select suitable face image training samples and samples to be recognized.
[0029] Face image samples are obtained from standard face databases, such as ORL, FERET, Yale and other face databases, or face samples are collected using cameras and other equipment. For the collected faces, in order to make the face images unified, the face images can be cropped, rotated, scaled, preprocessed, etc., so that they can be better applied to database building or recognition. The face library should contain different lighting, expressions, and poses, so that the face recognition method can have a stronger generali...
PUM
Abstract
Description
Claims
Application Information
- R&D Engineer
- R&D Manager
- IP Professional
- Industry Leading Data Capabilities
- Powerful AI technology
- Patent DNA Extraction
Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.
© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com