Color filter substrate and manufacturing method for same

Abstract

Provided are a liquid crystal display panel and a color filter substrate (32) and a manufacturing method thereof. The method comprises: forming a black matrix pattern (42, 52) in a pixel invalid area (401, 501) of a transparent substrate (40) to form a mark (42, 421, 52, 521); coating a transparent conductive layer (44, 441, 54, 541) on the pixel invalid area (401, 501) to cover the mark (42, 421, 52, 521); and performing patterning processing on the transparent conductive layer (44, 441, 54, 541), so that coverage characteristics of the transparent conductive layer (44, 441, 54, 541) are different at the mark (42, 421, 52, 521) and a peripheral zone of the mark (42, 421, 52, 521), thereby effectively enhancing the optical differences of the mark (42, 421, 52, 521) and the peripheral zone thereof under a CCD optical reading lens, improving the success rate of reading the mark (42, 421, 52, 521), and improving the production efficiency.

Description

technical field [0001] The invention relates to the technical field of liquid crystal display, in particular to a color filter substrate and a manufacturing method thereof. Background technique [0002] In the liquid crystal panel manufacturing process, the alignment mark (mark) plays an important role. When it is necessary to perform position confirmation and coordinate calculation, it is necessary to read the position of the alignment mark. For example, when performing coordinate positioning of precision measuring instruments and exposure alignment of exposure machines, it is necessary to read the position of the alignment marks; Confirm the group position of the substrate. [0003] see figure 1 , figure 1 It is a schematic diagram of setting the alignment mark on the existing color filter substrate. [0004] Such as figure 1 As shown, in the prior art, the transparent substrate 10 of the color filter substrate includes a plurality of effective pixel regions 100 and i...

AI Technical Summary

Problems solved by technology

[0006] When using a CCD (Charge-coupled Device, charge-coupled device) optical reading lens to read the position of the alignment mark 1010, since the coverage characteristics of the transparent conductive layer 120 on the alignment mark 1010 and the peripheral area of ​​the alignment mark 1010 are the same , has no optical difference, so the success rate of the CCD optical reading lens in reading the alignment mark 1010 is not high, and even the reading fails, which causes the deviation of the position calculation accuracy of the process or reduces the utilization rate of the equipment , leading to low production efficiency and capacity

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