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Temperature measuring device based on speckle interference and temperature measuring method adopting temperature measuring device

A technology of speckle interference and temperature measurement device, which is applied in measurement devices, thermometers based on material expansion/contraction, thermometers, etc., can solve the problems of small temperature measurement range, low temperature measurement result accuracy, and slow temperature measurement speed. , to achieve the effect of short imaging time, fast speed and dynamic measurement

Inactive Publication Date: 2014-07-16
ZHONGBEI UNIV
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0005] The present invention aims to solve the problems of low accuracy, small temperature measurement range and slow temperature measurement speed of the temperature measurement results obtained by the existing temperature measurement method, thereby providing a temperature measurement device based on speckle interference and using The temperature measurement method of the device

Method used

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  • Temperature measuring device based on speckle interference and temperature measuring method adopting temperature measuring device
  • Temperature measuring device based on speckle interference and temperature measuring method adopting temperature measuring device
  • Temperature measuring device based on speckle interference and temperature measuring method adopting temperature measuring device

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specific Embodiment approach 1

[0035] combine figure 1 Describe the specific embodiment, the temperature measuring device based on speckle interference, including computer 9, semiconductor laser 1 (green semiconductor laser), laser beam expander 2, half mirror 3, reference diffuse reflection surface 4, heat source 6, Optical filter 7 and CCD camera 8, heat source 6 is used for heating the object to be tested 5; Optical filter 7 is installed on the photographing end of CCD camera 8, is used for filtering out the radiation light after the heated object 5 to be tested; After the laser beam is expanded by the beam expander 2, it is incident on the half mirror 3, and the reflected light and the transmitted light are obtained after passing through the half mirror 3. The reflected light is incident on the front surface of the test piece 5 and produces object surface reflection light; the transmitted light obtained after the half mirror 3 is incident on the reference diffuse reflection surface 4 to generate diffuse...

specific Embodiment approach 2

[0036] The difference between this specific embodiment and the temperature measuring device based on speckle interference described in the first specific embodiment is that it also includes a green semiconductor laser 1 , and the laser emitted by the system is generated by the green semiconductor laser 1 .

specific Embodiment approach 3

[0037] The difference between this specific embodiment and the temperature measuring device based on speckle interference described in the second specific embodiment is that the optical filter 7 is a green light filter corresponding to the wavelength of the green semiconductor laser 1, and is used to filter out the Components are heated by radiating light.

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Abstract

The invention discloses a temperature measuring device based on speckle interference and a temperature measuring method adopting the temperature measuring device. The temperature measuring device based on speckle interference comprises a computer (9), a green light semiconductor laser (1), a laser beam expander (2), a transflective lens (3), a reference diffuse reflection surface (4), a heat source (6), an optical filter (7) and a CCD (Charge Coupled Device) camera (8), wherein the heat source (6) is used for heating a to-be-tested part (5), and the optical filter (7) is mounted at a shooting end of the CCD camera (8) and is used for filtering radiation light generated after the to-be-tested part (5) is heated. The problems of the present temperature measuring method that the obtained temperature measuring result is lower in accuracy, the temperature measuring scope is narrow and the temperature measuring speed is lower are solved by using the temperature measuring device based on speckle interference.

Description

technical field [0001] The invention relates to a temperature measuring device based on speckle interference and a temperature measuring method using the device. Background technique [0002] Temperature is an important parameter in scientific research and production, and the measurement of temperature is also an old problem. The technical theory of the traditional temperature measurement method is relatively perfect, but in many actual measurement occasions and special conditions, these temperature measurement methods have many problems, and it is difficult to meet the requirements by conventional measurement methods. Therefore, further research is needed. Improve the original method, or explore new temperature measurement methods to meet actual needs. [0003] Speckle interferometry technology is an optical measurement technology first proposed by J.M.Burch and J.T.Kardki in the late 1960s. It has non-contact, high measurement accuracy, low requirements for environmental ...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01K5/50
Inventor 王小燕杨凌连素杰李姝金侯晔星石佳任小芳张磊磊王绪财王高
Owner ZHONGBEI UNIV
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