Self-detection mending method for built-in self-test system
A built-in self-test and consistent technology, applied in static memory, instruments, etc., can solve the problem of long test time and achieve the effect of shortening test time
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[0018] In order to make the above-mentioned objectives, features and advantages of the present invention more obvious and understandable, the specific embodiments of the present invention will be described in detail below with reference to the accompanying drawings.
[0019] In the following description, many specific details are explained in order to fully understand the present invention. However, the present invention can be implemented in many other ways different from those described herein, and those skilled in the art can make similar extensions without violating the connotation of the present invention. Therefore, the present invention is not limited by the specific implementation disclosed below.
[0020] Below image 3 The process diagram shown as an example, combined figure 1 , A detailed description of the self-test repair method of a built-in self-test system provided by the present invention.
[0021] Such as figure 1 As shown, first, a memory 304' is provided. The mem...
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