In-situ transmission electron microscope (TEM) tensile table for researching mechanical property of material at specific temperature

Abstract

The invention discloses an in-situ transmission electron microscope (TEM) tensile table for researching mechanical property of a material at a specific temperature, and belongs to the field of TEM accessories and in-situ measurement and research of materials. The tensile table comprises a supporting part, a driving part and an intelligent stretcher; the supporting part is a metal ring; the driving part is a thermal bimetal sheet, one end of the thermal bimetal sheet is fixed on the metal ring, and the other end of the thermal bimetal sheet can move freely; the intelligent stretcher and the thermal bimetal sheet are arranged in parallel and distributed in the center of the metal ring; and the intelligent stretcher is slide glass prepared by a precision etching technology or a semiconductor technology, and sequentially comprises a tensile beam, a buffer, a correcting beam, a force measuring cantilever beam, a tensile beam and a correcting beam. Through the tensile table, in-plane stress can be conveniently applied to the material at the specific temperature, a sample can be conveniently obliquely transferred to the lower part of a low index positive belt shaft to realize observation of atomic scale, and stress signals are given at the same time.

Description

Technical field: [0001] The invention relates to a stretching table for studying the mechanical properties of materials at a specific temperature range in situ at the atomic scale under a transmission electron microscope. Tilt the sample to the low-index positive band axis to achieve atomic-scale observations and give stress signals at the same time. The invention belongs to the research field of transmission electron microscope accessories and in-situ measurement of materials. Background technique: [0002] Transmission electron microscope (hereinafter referred to as transmission electron microscope or electron microscope) is a modern large-scale instrument and a powerful tool for studying the microstructure of matter. It is widely used in physics, chemistry, material science, life science and other fields, especially the rapidly developing In the field of nano science and technology, it is one of the most powerful research tools. At present, the resolution of the transmis...

AI Technical Summary

Problems solved by technology

Although this method can realize the research on the deformation mechanism of materials at high temperatures, due to the relatively complex mechanical structure placed in the sample chamber of the transmission electron microscope, the sample stage can only be tilted at a small angle (±5°) or can only be tilted on a single axis. (not exceeding ±20°), it is powerless for crystal samples that need to be observed under the low-index positive band axis, so it limits its application range and is not conducive to popularization

[0003] It should be pointed out that although the above methods can realize the structural change information of the material at the atomic scale at different temperatures, or can realize the deformation of the material under high temperature deformation, they cannot study the change of the atomic scale of the material structure in situ at a specific temperature. information

This poses a great challenge to the study of people's correct understanding of the mechanical properties of materials at specific temperatures

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