Exposure frame data generation method used for dot-matrix maskless photoetching
A technology of maskless lithography and generation method, applied in the field of lithography, can solve the problems of increasing complexity, large calculation amount of exposure frame data, increasing time delay processing, etc.
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[0032] The present invention is implemented under the control of the program flow that generates the entire exposure frame data according to the three steps specified in the technical solution to solve the technical problem, and each step is equipped with a drawing mark:
[0033] The first step: graphics processing, data storage 1;
[0034] a) Rasterize the virtual area to be exposed that is consistent with the lateral size of the focal point of the digital micromirror device (DMD), such as figure 2 As shown, the area to be exposed corresponding to the DMD focus lattice 100 and its lateral size is scaled proportionally with a computer, and then the area to be exposed is gridded to 200, and each column 201, 202, 203, 204, 205 and so on correspond to the areas through which the focus points 111, 121, 131, 141, 151 etc. are scanned. The length of each column is determined by the exposure pattern, and the number of columns is equal to the number of DMD focus points. The distance...
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