High-temperature electric leakage testing system for diodes
A test system and diode technology, applied in the direction of single semiconductor device testing, electrical measurement, measurement device, etc., can solve the problems of difficulty in using manufacturer's test, limited number of test samples, limited test accuracy, etc., so as to improve power efficiency and reduce electronic Interference, fast switching effect
Inactive Publication Date: 2013-01-02
南通市通州区华昌电子有限公司
View PDF7 Cites 4 Cited by
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
[0003] However, since there is no testing equipment and instruments for detecting diode high-temperature leakage current on the market, the use of very cumbersome high-temperature test chambers, high-voltage current, leakage test instruments, and manual switching of samples for measurement, there is a problem that the test is very cumbersome and the number of test samples Very limited, limited test accuracy and many other flaws
It is even more difficult to achieve with factory testing
Method used
the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View moreImage
Smart Image Click on the blue labels to locate them in the text.
Smart ImageViewing Examples
Examples
Experimental program
Comparison scheme
Effect test
Embodiment Construction
[0025] Below in conjunction with accompanying drawing, technical scheme of the present invention is described in further detail:
[0026] Such as figure 1 combine figure 2 As shown, a diode high-temperature leakage test system of the present invention includes a stabilized power supply, a sample sampling module, a dynamic scanning measurement circuit, a leakage setting circuit, and a comparison output module. The regulated power supply module provides the output voltage to the sample sampling module; the dynamic scanning measurement circuit switches the sampling samples, and automatically measures the different samples in the sampling module according to the order of numbers; the setting value of the leakage setting module and the dynamic scanning measurement circuit are obtained The measured values are compared by the comparison output module, and the measured values and compared judgment results are output.
[0027] Such as Figure 4 The regulated power supply adopts...
the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More PUM
Login to View More Abstract
The invention discloses a high-temperature electric leakage testing system for diodes. The high-temperature electric leakage testing system comprises a stabilized voltage supply, a sampling module, a dynamic scanning measuring circuit, an electric leakage setting circuit and a comparison outputting module, wherein the stabilized voltage supply provides output voltage for the sampling module; the dynamic scanning measuring circuit sequentially automatically measures different testing samples in the sampling module through an analog switch, and outputs measured values to the comparison outputting module; and moreover, the dynamic scanning measuring circuit compares each measured value with a value set by the electric leakage setting circuit in the comparison outputting module, and then outputs judgment results. The high-temperature electric leakage testing system specially used for measuring the diodes can replace the traditional and troublesome method of manually measuring leakage current of the diodes to detect whether the diodes are qualified or not, has the advantage of high measurement accuracy, and can realize manual single-button switching measurement and automatic measurement switching.
Description
technical field [0001] The invention relates to a test system for electrical properties, which belongs to the leakage test system, in particular to a diode high-temperature leakage test system. Background technique [0002] As one of the products with the largest usage of diodes, electronic energy-saving lamps and LED energy-saving lamps are popular all over the world for their excellent performance of high light efficiency, high color rendering, energy saving and long life. The diodes used in energy-saving lamps work in a high-temperature environment for a long time, and have higher requirements for high-temperature performance, and the high-temperature electrical performance of the diode is mainly the high-temperature leakage current of the diode. Therefore, the diode manufacturer provides the high-temperature leakage current test data of the product when providing the diode product, and the user manufacturer needs to conduct incoming material inspection on the high-temper...
Claims
the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More Application Information
Patent Timeline
Login to View More Patent Type & Authority Applications(China)
IPC IPC(8): G01R31/02G01R19/165G01R31/26
Inventor 黄志飞
Owner 南通市通州区华昌电子有限公司